Fusion scope" Applications MICROSCOPY

Applications By combining the complementary strengths of SEM and AFM, FusionScope opens the door to a whole world of new application possibilities. Use the FusionScope for detailed Material Characterization of your samples and perform correlative analysis of their structural, mechanical, electrical, magnetic, and chemical properties on exactly the region of interest. Whether you are looking for high-level Quality Control of component parts or want to perform Failure Analysis on electrical components or semiconductor devices, FusionScope will help you to get the job done. Benefit from the fast...

Nanostructures Analyze Individual Nanowires using Profile View Mode: AFM Topography Sample: Nanowires (Figure 1) Top view of AFM and Nanowire on positioner. (Figure 2) Nanowires on posiitioner. (Figure 5) SEM Image of Nanowire tops. (Figure 6) AFM Image of Nanowire tops. (Figure 3) Profile View of AFM cantilever approaching Nanowire. (Figure 4) 3D model of AFM topography data of Nanowire. (Figure 7) Surface roughness of top of Nanowire Captured by AFM. (Figure 8) 3D model of AFM topography data of Nanowire top. The detailed characterization of individual nanowires using conventional AFM in combination...

Materials Characterization Characterize Magnetic Phase Structures using Magnetic Force Microscopy Mode: MFM Sample: Duplex Steel (Figure 1) Overview SEM image of duplex steel with cantilever. (Figure 2) SEM image of grain boundry on duplex steel. (Figure 3) AFM topography image at duplex steel grain boundry. (Figure 4) MFM image at duplex steel grain boundry showing ferromagnetic phase structure. Duplex is a family of stainless steel grades that contain a mixture of austenitic and ferritic phases that provide higher mechanical strength and ductility compared to standard steel grades. In-situ...

Quality Control & Failure Analysis Analyze Materials with Difficult Geometries using Atomic Force Microscopy Modes: SEM, AFM Topography Sample: Razor Blade (Figure 1) SEM image of AFM tip over blade edge. (Figure 2) Correlated data image of razor blade edge radius. (Figure 3) SEM video of AFM tip scanning blade edge. Typically, in atomic force microscopy, measurements of very pointed sample geometries are difficult. Firstly, due to the convolution of the geometry of the tip with the topography of the sample surface, but also the correct and reliable positioning of the tip over the sample is a...

Life Sciences Discover Properties of Hard-To-Reach Sample Areas using Atomic Force Microscopy Mode: AFM Topography Sample: Bone (Figure 1) SEM image of bone surface with cantilever. (Figure 2) SEM image of lacunae structure. (Figure 3) 3D AFM topography image of lacunae structure. (Figure 3) High-resolution AFM image of collegen fibers located inside the lacunae structure. The correlative analysis of hard-to-reach sample areas is always a challenging task. One example is the analysis of bone tissue, especially the detailed measurements of lacunae and collagen fibers on the bone surface. FusionScope...

*For complete specifications, contact your local Quantum Design office. Specifications subject to change without notice.

fusion scope' El Quantum Design Quantum Design, Inc. 10307 Pacific Center Court, San Diego, CA 92121 Tel: 858-481-4400 Fax: 858-481-7410 www.qdusa.com www.fusionscope.com | [email protected]