PST6747A Semiconductor Test Equipment High Power Semiconductor Test Platform PONOVO POWER CO., LTD. www.ponovo.net

PST6747A Semiconductor Test Equipment PST6747A semiconductor testing system is the professional instrument for measuring and analyzing the static parameters of power semiconductor devices, which can provide a complete test solution for all kinds of power semiconductor devices. PST6747A can measure and analyze the static parameters of power semiconductor devices accurately under 3KV (10kV, optional) and 2200A. PST6747A has the ability of fast pulse, fA level current detection capability, and has superior wide voltage and current measurement ability. These functions can be used to test the latest...

PST6747A Semiconductor Equipment PW336i Protection Test Relay Tester Source Module PST6747A has the function of adding source module in a stacked manner, which can expand multiple source modules easily. PST6747A can test a wide range of power semiconductor, the current output range is from 100fA to 2200A, the voltage output range is from 25μV to 3000V, and it has 3000V CV test function. Medium voltage source module P6703B High voltage source module P6701B Low voltage source module P6704B High current source module P6705A P6701B - High voltage source module parameters Voltage output range ±200V...

PST6747A Semiconductor Test Equipment P6703B - Medium voltage source module parameters Voltage output range ±0.5V ±2V ±20V ±40V ±100V ±200V Note: ± (% of reading value + offset value in mA) Current output range ±1nA ±10nA ±100nA ±1µA ±10µA ±100µA ±1mA ±10mA ±0.1A ±1A Note: ± (% of reading value + fixed offset value in A + proportional offset value in A), Vo is the output voltage in V P6704B (P6702A)- Low voltage source module (unit) parameters Voltage output range ±0.5V ±2V ±20V ±40V ±60V Note: ± (% of reading value + offset value in mA) Current output range ±10µA ±100µA ±1mA ±10mA ±0.1A ±1A...

PST6747A Semiconductor Test Equipment Current output range ±100A ±500A ±1500A ±2200A Note: ± (% of reading value + fixed offset value in A + proportional offset value in A), Vo is the output voltage in V P6705A - Pulse output Current output range ±100A ±500A ±1500A ±2200A Pulse width Pulse period Series resistance Duty cycle ≤ 0.4% Duty cycle ≤ 0.4% Duty cycle ≤ 0.1% Duty cycle ≤ 0.05% P6707A - Capacitor test module Test signal Output frequency Min Resolution Accuracy Voltage Output(rms) Resolution(rms) Accuracy Output impedance Typical Test signal monitoring Input(rms) Resolution(rms) 10mV-250mV...

PST6747A Semiconductor Test Equipment PST6747A Software PST6747A software has 6 options of different semiconductor, including IGBT, MOSFET, BJT, Diode, OCEP and Rectifier bridge. Each type semiconductor has various test templates, user only need to select the corresponding template in the test library and then fill in the parameters, click Run button then test automatically. There are two test modes: Application Test and Quick Test. Application Test Application test mode has a library of predefined tests, eliminating the need for users to set manually. User only need to select the corresponding...

PST6747A Semiconductor Test Equipment  PST6747A Application Test Template - IGBT For IGBT test, there are 15 test items, including VGE(th)(off), VGE(th), IGES, IC-VCE, VCEsat, IC-VGE, IC-VGE for Expanders, VF, VGES, ICES, Cce, Cres, Cies, Coes and V(BR)CES. Each test item has 2 modes. VGE(th) (off)  This template is for gate-emitter threshold voltage (open circuit) test  Can test minimum and maximum values at specified collector-emitter voltage and collector current  The used module is P6703B/ P6704B VGE(th)  This template is for gate-emitter threshold voltage (short circuit) test  Can...

PST6747A Semiconductor Test Equipment IGES  This template is for gate leakage current test  The leakage current into the gate terminal at a specified gate-emitter voltage with the collector terminal shortcircuited to the emitter terminal  The used module is P6703B/ P6704B IC-VCE  This template is for output characteristics test  When the gate-emitter voltage is a specified value, test the state of the current varies with the voltage between collector-emitter  The used module is P6704B/P6705A VCEsat  This template is for collector-emitter saturation voltage test  Test collector-emitter...

PST6747A Semiconductor Test Equipment IC-VGE  This template is for transfer characteristic test  When the collector-emitter voltage is the specified value, test the state of collector current (≤1A) varies with gateemitter voltage  The used module is P6703B/P6704B IC-VGE for Expanders  This template is for transfer characteristic test  When the collector-emitter voltage is the specified value, test the state of collector current (>1A) varies with gateemitter voltage  The recommendation module is P6704B/P6705A  VF  This template is for diode forward voltage test  Test the emitter-collector...

PST6747A Semiconductor Test Equipment VGES  This template is for gate-emitter voltages with collector emitter short circuit test  Can test maximum positive and negative values  The used module is P6703B/P6704B ICES  This template is for collector-emitter cut-off current test  Can test collector-emitter cut-off current with gate-emitter is short circuit and under the specified collector-emitter voltage condition  The used module is P6701B/ P6704B Cce  This template is for collector-emitter capacitance test  The used module is P6701B/ P6707A

PST6747A Semiconductor Test Equipment Cres  This template is for reverse transfer capacitance test  Can test capacitance between the collector and gate terminals  The used module is P6701B/ P6707A Cies  This template is for input capacitance test  Test capacitance between the gate and emitter terminals with the collector terminal short-circuited to the emitter terminal for a.c.  The used module is P6701B/ P6707A Coes  This template is for output capacitance test  Test capacitance between the collector and emitter terminals with the gate terminal short-circuited to the emitter terminal...