TopMap Micro.View | Optical surface profiler for surface form, nm-roughness and finishform
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TopMap Micro.View & Micro.View+ TopMap Micro.View & Micro.View+ Next generation optical profiler Product brochure

Measure surface roughness -2° Non-contact characterization of surface details For measuring the finest details in surfaces, the TopMap series of optical profiler systems are the preferred solution. From microscopes to macroscopes, Polytec has a product to meet the toughest of applications needs. Material science / tribology Since 1967 Polytec has continued to deliver leading edge optical measurement technology. The latest generation optical profilers, the TopMap Micro.View® and Micro.View®+ offer unparalleled capabilities. Analyze all types of surfaces for roughness, microstructures, wear,...

Optical 3D profiling with cutting-edge Coherence Scanning Interferometry (CSI) Reliable, precise, innovative Micro.View® and Micro.View®+ are the next generation optical surface profilers. The Focus Finder and Focus Tracker greatly enhance the ease of use under all conditions, and, the CST Continuous Scanning Technology allows for using the entire travel range of up to 100 mm as extended measurement range. Distinguish and document defects and visual distortions with the latest color information imaging analysis. Quantify surface topography with sub-nanometer resolution and capture the...

TopMap Micro.View® Table-top optical surface profiler ECT ENVIRONMENTAL COMPENSATION TECHNOLOGY FOR HARSH PRODUCTION ENVIRONMENTS EXTENDED 100 MM Z-MEASUREMENT RANGE WITH CST CONTINUOUS SCANNING TECHNOLOGY COMPARABLE SPECIFICATIONS TABLE-TOP SETUP WITH INTEGRATED ELECTRONICS FOCUS FINDER INTEGRATED VIBRATION ISOLATION FOR ALL-TIME STABLE MEASUREMENTS TopMap Micro.View® is an easy to use and compact optical profiler. Combine exceptional performance and affordability with this powerful metrology solution. An extended 100 mm Z-measurement range with CST Continuous Scanning Technology allows...

TopMap Micro.View®+ Next generation optical surface profiler EXTENDED 100 MM Z-MEASUREMENT RANGE WITH CST CONTINUOUS SCANNING TECHNOLOGY 5MP CAMERA DELIVERS INCREDIBLY DETAILED 3D DATA VIZUALIZATION DETAILED ANALYSIS WITH NM RESOLUTION & COLOR INFORMATION QC PACKAGE SIMPLIFIES INSPECTIONS IN MANUFACTURING MOTORIZED AND ENCODED TURRET FOCUS FINDER + FOCUS TRACKER FULLY MOTORIZED SAMPLE POSITIONING (X, Y, TIP/TILT) TopMap Micro.View®+ is the next generation optical surface profiler. Designed for modularity, this comprehensive workstation allows for customized and application-specific...

Precision measurement driven by innovation 01 CST Continuous Scanning Technology With the integrated CST Continuous Scanning Technology, the optical profiler uses the entire travel range for measuring smoothly and continuously. This means more positioning freedom, faster setup and less maintenance. Positioning range = Measurement range Benefits Extended measurement range High performance data acquisition for full range of motion limited measurement range recision Z drive P Part focus and measurement with one stage Extended vertical range Measure tall samples Maximum flexibility in sample...

Focus Tracker Keep the object surface in focus with automated readjustment and minimize time between measurements. As a fully motorized configuration (X, Y, Z, and tip/tilt) the Micro.View®+ with Focus Tracker delivers repeatable and reproducible measurements in all positions. Initial position: in focus Out of focus after leveling With Focus Tracker X, Y, Z follow Benefits lways in-focus/ automated re-adjustment A Automated focus tracking saves repositioning F ully motorized turret, XY, Z, tip/tilt Reproducible measurements Focus Tracker follows the measurement position Benefits...

Data acquisition Integrated software as complete solution POSITIONING MEASUREMENT I L L U M I N AT I O N Data evaluation FORM DEVIATION Automation Reporting Analyse 3D surface data with extensive set of surface parameters (including ISO 25178) and thanks to direct access to acquisition settings use them as further decision criteria for your analysis. Setup the data acquisition in detail for repeatable measurement and traceable results. Generate, save and load acquisition settings with ease. Easy „customization“ thanks to Value Area / Reference single source of software Profile Value...

Outstanding measurement performance & capability Characterizing small details and microstructures Sample: polished optical surface High-resolution roughness measurement <1nm Sample: polished silicon surface Surfaces with high slopes and steep angles Sample: dental implant screw

+ SENSOR HEAD Micro.View with optional focus finder Micro.View+ with optional color information and 5MP camera motorized (Micro.View+ only) Only Micro.View Passive or active options (pneumatic or electronic control)

1 Sparrow criterion, objective dependent 2 Z correlogram algorithm sensitivity, smallest vertical detail shown in digital data 3 Minimum measureable Sa roughness parameter, measured with 3 pixel filtering and spike removal 4 Surface and objective dependent 5 Limited by working distance of objective 6 Depends on size of area of interest (AOI) and sampling increment. Given value for reduced AOI and 327 nm sampling increment

Shaping the future since 1967 OM_PB_MicroView_E_52174 2024/04 -Technical specifications are subject to change without notice. High tech for research and industry. Pioneers. Innovators. Perfectionists. Find your Polytec representative: www.polytec.com/contact Polytec GmbH · Germany Polytec-Platz 1-7 · 76337 Waldbronn