TopMap Micro.View® optical profiler
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TopMap Micro.View® optical profiler - 1

TopMap Micro.View® TopMap Micro.View® is an easy to use and compact optical profiler. Combine exceptional performance and affordability with this powerful metrology solution. This white-light interferometer with an extended 100 mm z measurement range with Continuous Scanning Technology (CST) allows complex topographies to be measured at nm resolution. This convenient table-top setup features integrated electronics, with the smart focus finder simplifying and speeding up the measurement procedure. Benefit from the optional ECT Environmental Compensation Technology, enabling reliable and accurate measurement results even in noisy and challenging production environments. Micro.View® is the cost-effective quality control instrument for inspecting precision engineered surfaces in the field of manufacturing and research. TopMap Micro.View® Table-top optical surface profiler Datasheet Measure surface finish in a compact setup Non-contact measurement of 3D topography, roughness and texture 100 mm Z measurement range with CST Continuous Scanning Technology Excellent lateral resolution Determine surface defects Choose from application-specif

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TopMap Micro.View® optical profiler - 2

Technical data The information for the model TMS-1400 TopMap Micro.View® comply with the initiative "Fair Data Sheet" for optical surface measurement devices. General features 1 Positioning volume 2 Max. number of measuring points in a single measurement Max. number of measuring points in a stitched measurement Working distance Vertical measuring range 7 Numerical aperture Calculated maximum angle Measuring point spacing X, Y Calculated lateral optical resolution Performance features Measurement noise 1,3,4 Surface topography repeatability 3,5 General specifications Dimensions [L x W x H]...

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TopMap Micro.View® optical profiler - 3

Application-specific features Typical flatness measurement Method of acquistion and evaluation Coherence scanning on smooth surfaces 2 Coherence scanning on rough surfaces 3 Typical step height measurement 7.5 µm 6 Maximum deviation of a step height measurement 1,8 Nominal step height Other features Measuring principle Coherence scanning interferometry (Michelson/Mirau objectives) Optical setup Microscope system; Light source: long-life LED, 525 nm Data formats Topography formats: SUR, ASCII, STL, X3P Export formats: qs-STAT, PDF, BMP, PNG, TIFF, GIF Configuration possibilities Hardware...

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TopMap Micro.View® optical profiler - 4

Configuration of the optical profiler AF AF GREEN GREEN GREEN RGB RGB GREEN GREEN AF AF Micro.View® sensor head with or without focus finder Base stand Different positioning stages manual XY or motorized XY 75 mm x 75 mm, Including tip-tilt Active vibration isolation breadboard OM_DS_TMS-1400_TopMap_MicroView_E_52062 2022/08 - Technical specifications are subject to change without notice. Shaping the future since 1967 High tech for research and industry. Pioneers. Innovators. Perfectionists. Find your Polytec representative: www.polytec.com/contact Polytec GmbH · Germany Polytec-Platz 1-7 ·...

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