TopMap Micro.View® optical profiler
1 / 4Pages

TopMap Micro.View' O Polytec TopMap Micro.View® is an easy to use and compact optical profiler. Combine exceptional performance and affordability with this powerful metrology solution. This white-light interferometer with an extended 100 mm z measurement range with Continuous Scanning Technology (CST) allows complex topographies to be measured at nm resolution. This convenient table-top setup features integrated electronics, with the smart focus finder simplifying and speeding up the measurement procedure. Benefit from the optional ECT Environmental Compensation Technology, enabling reliable and accurate measurement results even in noisy and challenging production environments. Micro.View® is the cost-effective quality control instrument for inspecting precision engineered surfaces in the field of manufacturing and research. ■ Measure surface finish in a compact setup ■ Non-contact measurement of 3D topography, roughness and texture ■ 100 mm Z measurement range with CST Continuous Scanning Technology ■ Excellent lateral resolution ■ Determine surface defects ■ Choose from application-specific objectives TopMap Micro.View®

Technical dataThe information for the model TMS-1400 TopMap Micro.View® comply with the initiative "Fair Data Sheet" for optical surface measurement devices. Phase evaluation According to the initiative "Fair Data Sheet", 30 measurements (10x objective, 16.5 pm/sec, 92% FOV) on a parallelly aligned plane mirror (R > 93%, X/10). Postprocessing: alignment, 5 x 5 median filter with threshold 3 nm (phase evaluation)/40 nm (envelope evaluation), high pass filter Xc = 0.25 mm According to DIN EN ISO 25178-604:2013-12 30 measurements (10x objective, 16.5 pm/sec, 92% FOV with 3x3 median filter) on...

Complies with the initiative “Fair Data Sheet" for optical surface measurement devices Evaluation of the correlogram phase Evaluation of the correlogram envelope Mean value of the flatness (according to ISO 1101) from 30 measurements (10x objective, 16.5 pm/sec, 92% FOV) on a parallely aligned plane mirror (R>93%, X/10). Postprocessing: Alignment, 5x5 median filter with threshold 3 nm (phase evaluation)/30 nm (envelope evaluation), low pass filter Xc=0.02mm Standard deviation of the measured flatness values from 4 15 measurements (10x objective, 16.5 pm/sec) per step on a calibrated depth...

Configuration of the optical profiler AF AF GREEN GREEN GREEN GREENRGB GREEN RGB RGB GREEN GREEN AF AF Micro.View® sensor head with or without focus finder Base stand Different positioning stages manual XY or motorized XY 75 mm x 75 mm, Including tip-tilt Active vibration isolation breadboard OM_DS_TMS-1400_TopMap_MicroView_E_52062 2025/02 - Technical specifications are subject to change without notice. Shaping the future since 1967 High tech for research and industry. Pioneers. Innovators. Perfectionists. Find your Polytec representative: www.polytec.com/contact Polytec GmbH · Germany...