TopMap Micro.View®+ optical modular profiler
4Pages

TopMap Micro.View®+ / Micro.View®+ Compact TopMap Micro.View®+ is the next generation optical surface profiler. Designed for modularity, this comprehensive workstation allows for customized and application-specific configurations. The Micro.View®+ delivers the most detailed analysis of surface roughness, texture and microstructure topography. Combine 3D data with color information for amazing vizualizations and extended analysis like detailed documentation of defects. The high-resolution 5 MP camera delivers incredibly detailed 3D data vizualization of engineered surfaces. The encoded and motorized turret secures a seamless transition between objectives. Micro.View®+ features the latest Focus Finder plus Focus Tracker, keeping the surface in focus at all circumstances. The fully motorized sample positioning stages allow for stitching and automation. TopMap Micro.View®+ Next generation optical surface profiler Datasheet High-end white-light interferometer with nm resolution 100 mm z measurement range with CST Continuous Scanning Technology With Focus Finder and Focus Tracker ready for automation Motorized X, Y, Z, tip/tilt and turret save repositioning Color information mode for extended analysis and documentation of defects Modular, application-spec

Technical data The information for the model TMS-2400 TopMap Micro.View®+ comply with the initiative "Fair Data Sheet" for optical surface measurement devices. Please ask Polytec for additional information for the configuration with 5 MP camera. General features 1 Micro.View®+ Compact Max. number of points in a single measurement Max. number of measuring points in a stitched measurement 500 million Micro.View®+ Compact Objective-specific features 1 2.5X X: mm, Y: mm, X · Y: mm X: 0.93 X: 3.73 X: 2.33 X: 1.87 X: 0.93 X: 0.47 X: 0.19 X: 0.09 X: 0.08 Y: 2.81 Y: 1.76 Y: 1.41 Y: 0.70 Y: 0.70 Y:...

Application-specific features Typical flatness measurement Method of acquistion and evaluation Coherence scanning on smooth surfaces 2 Coherence scanning on rough surfaces 3 Flatness deviation 1,4 Repeatability Typical step height measurement Nominal step height Maximum deviation of a step height measurement 1,8 Other features Measuring principle Coherence scanning interferometry (Michelson/Mirau objectives) Optical setup Microscope system; Light source: long-life LED, 525 nm Data formats Topography formats: SUR, ASCII, STL, X3P Export formats: qs-STAT, PDF, BMP, PNG, TIFF, GIF...

Configuration of the optical profiler Micro.View®+ Micro.View®+ sensor head, standard or 5 MP camera, with or without color information, with or without focus finder Micro.View®+ Compact Messkopf optional AF mit Focus Finder Motorized or RGBRGB manual turret Motorized or manual turret GREEN GREEN GREEN GREEN Objectives Different positioning stages, manual XY or motorized XY 75 mm x 75 mm, including tip-tilt Positioning stage motorized XY 200 mm x 200 mm, manual or motorized tip-tilt BGR NEERG Base stand Spacers for sample heights up to 370 mm Active vibration isolation breadboard Optical...