Flyer TopMap Micro.View(+) optical 3D surface metrology for roughness, texture and microstructure analysis
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Polytec Customer information Xperts inside! TopMap Micro.View® & Micro.View®+ Optical 3D surface metrology www.polytec.com

Measure surface roughness Non-contact characterization of surface details Analyze microstructures For measuring the finest details in surfaces, the TopMap series of optical profiler systems are the preferred solution. From microscopes to macroscopes, Polytec has a product to meet the toughest of applications needs. Since 1967 Polytec has continued to deliver leading edge optical measurement technology. The latest generation optical profilers, the TopMap Micro.View® and Micro.View®+ offer unparalleled capabilities. Analyze all types of surfaces for roughness, microstructures, wear, sealing...

Innovative optical surface profilers TopMap Micro.View® and Micro.View®+ Xper t KNOW-HOW INCLUDED Reliable, precise, innovative Micro.View® and Micro.View®+ are the next generation optical surface profilers. The Focus Finder and Focus Tracker greatly enhance the ease of use under all conditions, and, the CST Continuous Scanning Technology allows for using the entire travel range of up to 100 mm as extended measurement range. Distinguish and document defects and visual distortions with the latest color information imaging analysis. Quantify surface topography with sub-nanometer resolution...

TopMap Micro.View® Table-top optical surface profiler ECT ENVIRONMENTAL COMPENSATION TECHNOLOGY FOR HARSH PRODUCTION ENVIRONMENTS EXTENDED 100 MM Z-MEASUREMENT RANGE WITH CST CONTINUOUS SCANNING TECHNOLOGY COMPARABLE SPECIFICATIONS ACCORDING TO FAIR DATA SHEET TABLE-TOP SETUP WITH INTEGRATED ELECTRONICS FOCUS FINDER INTEGRATED VIBRATION ISOLATION FOR ALL-TIME STABLE MEASUREMENTS TopMap Micro.View® is an easy to use and compact optical profiler. Combine exceptional performance and affordability with this powerful metrology solution. An extended 100 mm Z-measurement range with CST Continuous...

TopMap Micro.View®+ Next generation optical surface profiler EXTENDED 100 MM Z-MEASUREMENT RANGE WITH CST CONTINUOUS SCANNING TECHNOLOGY 5MP CAMERA DELIVERS INCREDIBLY DETAILED 3D DATA VIZUALIZATION DETAILED ANALYSIS WITH NM RESOLUTION & COLOR INFORMATION QC PACKAGE SIMPLIFIES INSPECTIONS IN MANUFACTURING MOTORIZED AND ENCODED TURRET FOCUS FINDER + FOCUS TRACKER FULLY MOTORIZED SAMPLE POSITIONING (X, Y, TIP/TILT) TopMap Micro.View®+ is the next generation optical surface profiler. Designed for modularity, this comprehensive workstation allows for customized and application-specific...

Precision measurement driven by innovation 01 CST Continuous Scanning Technology With the integrated CST Continuous Scanning Technology, the optical profiler uses the entire travel range for measuring smoothly and continuously. This means more positioning freedom, faster setup and less maintenance. Positioning range = Measurement range Benefits Extended measurement range High performance data acquisition for full range of motion limited measurement range P recision Z drive Part focus and measurement with one stage Extended vertical range Measure tall samples Maximum flexibility in sample...

Focus Tracker Keep the object surface in focus with automated readjustment and minimize time between measurements. As a fully motorized configuration (X, Y, Z, and tip/tilt) the Micro.View®+ with Focus Tracker delivers repeatable and reproducible measurements in all positions. Initial position: in focus Out of focus after leveling With Focus Tracker X, Y, Z follow Benefits A lways in-focus/ automated re-adjustment Automated focus tracking saves repositioning F ully motorized turret, XY, Z, tip/tilt Reproducible measurements Focus Tracker follows the measurement position Benefits...

Polytec TMS Software as complete solution The powerful TMS Software (Topography Measurement System) offers an array of options as one-stop solution for surface analysis. The latest generation software suite acquires precision data and allows for a range of post-processing to highlight the parameter of interest. A few mouse clicks is all it takes to automatically run a measurement with pre-defined settings. Now compatible with a barcode scanner, the complete measurement sequence can be automated with minimal user input. Data acquisition POSITIONING MEASUREMENT I L L U M I N AT I O N SIGNAL...

Easy „customization“ thanks to Value Area / Reference single source of software development Profile Value Top Left / Right Step height Pre-defined measurement recipes help reduce complexity with an intuitive user interface. The QC Operator Interface is ideal for routine and repetitive inspections. Generate and update reports concurrently with a simple set-up in the all-in-one TMS software. Ensure traceability by also recording evaluation step

Configuration of optical profilers Micro.View® Table-top surface profiler AF AF GREEN GREEN GREEN RGB RGB GREEN GREEN AF AF MICRO.VIEW® SENSOR HEAD WITH OR WITHOUT FOCUS FINDER BASE STAND DIFFERENT POSITIONING STAGES MANUAL XY OR MOTORIZED XY 75 MM X 75 MM, INCLUDING TIP-TILT BREADBOARD

+ SPACERS FOR SAMPLE HEIGHTS UP TO 370 MM + OPTICAL TABLE, PNEUMATICALLY OR ELECTRONICALLY CONTROLLED

Shaping the future since 1967 OM_FL_MicroView_E_52060 2020/09 -Technical specifications are subject to change without notice. High tech for research and industry. Pioneers. Innovators. Perfectionists. Find your Polytec representative: www.polytec.com/contact Polytec GmbH · Germany Polytec-Platz 1-7 · 76337 Waldbronn