Brochure TopMap series | Optical 3D surface metrology systems
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Brochure TopMap series | Optical 3D surface metrology systems - 1

TopMap family TopMap family Surface metrology in a new dimension Product brochure

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Brochure TopMap series | Optical 3D surface metrology systems - 2

Quality inspection of precision surfaces In order to characterize precision-manufactured and other sophisticated surfaces, it needs measurement technology that is reliable, quick and application-oriented. Guaranteeing functionality and detecting defects at an early stage avoids un ecessary cost and increases the n overall product quality and lifetime. Polytec addresses surface metrology applications with innovative, high-precision, non-contact optical technology that works on rough, smooth and stepped surfaces. White-light interferometers of the TopMap family are established quality...

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Areal surface measurement with white-light interferometry CAMERA Structured functional surfaces with tight tolerances require high-precision measurement systems that can quickly scan the topography of a workpiece. Wellestablished white-light interferometry achieves a resolution at the nanometer scale. BEAM SPLITTER REFERENCE BEAM REFERENCE PLANE MEASUREMENT BEAM Principle of scanning white-light interferometry (Michelson setup) Non-contact, non-destructive and repeatable areal information in 3D – don’t overlook Full any details almost any surface On Excellent lateral resolution Check...

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Brochure TopMap series | Optical 3D surface metrology systems - 4

Versatile use A wide range of applications Polytec’s TopMap surface measurement systems are in their element in all operations where the finest components and structures need to be inspected. Non-contact white-light interferometry allows measurements with a resolution in the nanometer or even subnano meter range. Form deviation Warpage measurements Pump barrel Cone measurement And it’s for this very reason that Polytec’s TopMap devices have become standard tools in the field of industrial quality control. Sealing surfaces Membrane measurement Optical components Configuration with portal...

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Form parameter Height & Steps Check manufacturing tolerances quickly … with high precision, high repeatability and based on traceable standards. With large vertical range and nanometer resolution, Polytec’s TopMap systems are ideal for determining flatness, step-height and parallelism of large surfaces and structures, of a wide variety of materials.

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TopMap Metro.Lab Compact 3D workstation The TMS-150 TopMap Metro.Lab from Polytec is a high- precision white-light interferometer (coherence scanning interferometer) with a large vertical measurement range. The TopMap Metro.Lab is ideally suited for non-contact measurement of flatness, step height and parallelism of large surfaces and structures even on soft or delicate materials. The entry-level of white-light interferometry As a complete and compact 3D measurement workstation, the TopMap Metro.Lab allows the user to perform measure ments with a large field-of-view and nanometer...

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For production integration The TMS-350 TopMap In.Line is totally tailored to the needs of quality assurance in production, when cycle times are decisive and surfaces have to be measured precisely, without contact at a high speed. Fast characterization in the production line The compact design of the TopMap In.Line means it can be elegantly and safely integrated into the production line. Since no objectives are needed, collisions and damage to the optics or component surfaces are avoided. The system measures form deviations, such as flatness or waviness, reliably and with short cycle times....

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Table-top optical surface profiler TopMap Micro.View® is an easy to use and compact optical profiler. Combine exceptional performance and affordability with this powerful metrology solution. An extended 100 mm Z measurement range with CST Continuous Scanning Technology allows complex topographies to be measured at nm resolution.This conventient table-top setup features integrated electronics, with the smart focus finder simplifying and speeding up the measurement procedure. Small footprint with expanded capability Benefit from the optional ECT Environmental Compensation Technology, securing...

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TopMap Micro.View®+ Next generation optical surface profiler TopMap Micro.View®+ is the next generation optical surface profiler. Designed for modularity, this comprehensive workstation allows for customized and application-specific configurations. The Micro.View®+ delivers the most detailed analysis of surface roughness, texture and microstructure topography. Combine 3D data with color information for amazing vizualizations and extended analysis like detailed documentation of defects. The high-resolution 5 MP camera delivers incredibly detailed 3D data visualization of engineered surfaces....

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TopMap Pro.Surf The surface specialist The TMS-500 TopMap Pro.Surf quickly, reliably and precisely determines form deviation. The TopMap Pro.Surf white-light interferometer is the ideal solution for non-contact surface topography measurement of precision-made surfaces – in the metrology lab, close to production or even right in the production line thanks to a robust design and a high level of repeatability. For reliable checking of precision-made surfaces Its high vertical and lateral resolution, the telecentric optical design and the high measurement speed open up many applications. Two...

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TopMap Pro.Surf+ The all-in-one system The TMS-500-R TopMap Pro.Surf+ conveniently determines form both deviation and roughness in one single system – fast, reliable and precise. The upgrade of the high-end system TopMap Pro.Surf represents an all-in-one solution – thanks to the integrated roughness sensor. Combined measurement of form deviation plus roughness TopMap Pro.Surf+ offers a powerful multisensor solution to characterize surface topography by precisely determining both form parameters such as flatness, step height, parallelism and roughness parameters. Besides its intelligent...

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Polytec TMS Software as complete solution The powerful TMS Software (Topography Measurement System) offers an array of options as one-stop solution for surface analysis. The latest generation software suite acquires precision data and allows for a range of post-processing to highlight the parameter of interest. A few mouse clicks is all it takes to automatically run a measurement with pre-defined settings. Now compatible with a barcode scanner, the complete measurement sequence can be automated with minimal user input. Data acquisition POSITIONING MEASUREMENT I L L U M I N AT I O N SIGNAL...

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