3D surface characterization using whitelight-interferometry - areal and 3D, non-contact
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Surface metrology O Polylec Surface metrology When accuracy matters Competence field

The need for non-contact surface metrology is growing continuously and spans all industries. No wonder, consistent performance and reliability are essential criteria to establishing oneself in the market and remaining successful in the long term. Highly accurate measurements ■ In the controls laboratory and R&D areas ■ On almost any workpiece surface ■ With z-resolution independent of field-of-view Routine measurements ■ Simple operation and automated evaluation ■ One-click solution for operator-independent results ■ Close to the production line or in the control laboratory Automated...

As a successful developer of high-quality optical measurement systems, Polytec is an experienced partner for surface measurements in nearly all application fields. We have been supplying high-end solutions to automotive, aviation and aerospace, steel, engineering, chemical, textile and paper industries for more than four decades. We implement customized systems in terms of the size of the area of interest, the resolution and other special needs of each measurement task.

Measuring with light – non-contact, fast and extremely accurate

Modern white-light interferometers from Polytec use the interference effects that occur when the measured light reflection from the object is superimposed on light following the same path length reflected from a high-precision reference mirror. The object is scanned by traversing that mirror. A perfect interaction of all functions ensures flexible adaptability The measurement method is based on the principle of Michelson interferometry, where the optical configuration contains a light source with a coherence length in the μm range. A beamsplitter splits the collimated light beam into a...

Polytec is a worldwide leader in technology for optical topographic measurement of large areas with nanometer precision. Areas to be examined are often at the base of deep holes or have large height differences - Polytec's topography measurement systems (TMS) provide the solution. Functionality requirements of technical surfaces are often very demanding, requiring more frequent compliance with the tightest tolerances. In such cases, measurements with resolutions in the submicrometer range, or even down to a few nanometers, are necessary in order to meet those requirements. Check...

Flatness and waviness measurements Regarding functional surfaces, flatness is often decisively important. Examples are parts with sealing surfaces for pressure and vacuum technology, and also transparent foils for displays, semiconductor components, metal and ceramics surfaces. TopMap systems allow you to measure large areas up to 200 x 200 mm2 and get a fast, complete characterization of the workpiece. Under optimal conditions you can achieve precision in the subnanometer range. Relative position of two surfaces Determining parallelism, height differences or angles between several surfaces...

PolyXpert Services Specialists in topography of microscopic structures The use of short-coherent white light makes the microscope system TopMap µ.Lab the specialist for non-contact measurement of microstructures with an excellent lateral resolution (< 0,5 µm). For example, measurements on micro-sensors and micro-actuators as well as structured plates and bearing surfaces. TopMap μ.Lab offers high-performance evaluation functionality. Larger surfaces can be tested by stitching several measurements together.

Microstructured surfaces Material processing Functional surfaces often require the presence or absence of certain structural characteristics. For example, it can be very important to evaluate the type and frequency of pores used to hold lubricant between frictional surfaces in motors or connecting rod eyes. The same applies to surface structures needed for improved adhesion of coatings in the steel industry. Unwanted structures must also be analyzed because they increase frictional forces or cause unwelcome vibrations. Topography measurements with high lateral resolution are important when...

Polytec‘s TopMap systems are based on the established measurement principle of whitelight interferometry. The height resolution is not affected by the chosen size of the fieldof-view. A wide range of different surfaces, from MEMS components to sealing surfaces manufactured with high precision, can be captured with high repeatability. The TMS TopMap systems offer you efficient analyzing possibilities that can be automated, no matter whether it is in the measurement laboratory or for 100% inspection in the production-line. Many benefits for your tasks Large surfaces measurable Up to 2 million...

Large reflectivity variations are accomodated Raw data without smoothing Workpieces often reflect with different intensities, as on highly reflective surfaces with different viewing angles. For such cases, Polytec has developed “Smart Surface Scanning” technology that measures the surface several times with different camera exposure times. Software automatically calculates optimal exposure time and applies it for each pixel. The original data can be used to a large extent without post processing through filters or smoothing, when performing good measurements. You can significantly increase the...

PolyXpert Services TopMap – an extremely accurate family TopMap Pro.Surf+ The all-in-one system Polytecs all-in-one system: TMS-500-R TopMap Pro.Surf+ combines the precision of a white-light interferometer and a chromatic confocal sensor to conveniently measure form deviations plus roughness with one device. TopMap Pro.Surf+ measures large areas with nanometer resolution. TopMap Pro.Surf The surface specialist Ideal for quick and precise 3D surface characterization, the TMS-500 TopMap Pro.Surf with its areal measurement does not miss any details. Short measuring times and a large field of...

Whether you need a fast throughput in the production-line, high resolution laboratory measurements or in universal applications – Polytec offers you different models of TopMap systems, perfectly adapted to your requirements. All TopMap models are equipped with operator-friendly TMS Software from Polytec. TopMap In.Line For production integration TopMap µ.Lab The microscope system TopMap Metro.Lab Compact 3D workstation The compact design of the TMS-350 TopMap In.Line and its very short measurement time allow an easy integration into the production line for a quick and reliable quality...