Precision Drives for Electron Microscopy
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Precision Drives for Electron Microscopy - 1

Precision Drives for Electron Microscopy Precision Drives for Positioning and Moving of Specimen in TEM, Scanning TEM, Cryo-TEM, SEM and for the Vitrification of Samples for Cryo-TEM Onto Metal Grids Physik Instrumente (PI) GmbH & Co. KG, Auf der Roemerstrasse 1, 76228 Karlsruhe, Germany Phone +49 721 4846-0, Fax +49 721 4846-1019, Email info@pi.ws, www.pi.ws

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Precision Drives for Electron Microscopy - 2

Precision Drives for Electron Microscopy Electron Microscopy Applications for electron microscopy cover a broad spectrum from semiconductor inspection, through materials research to molecular biology research. In conventional TEM as well as in the newer Cryo-TEM, which was awarded the Nobel Prize in 2017, the samples have to be precisely nanopositioned with precision in an XYZ coordinate and then tilted around one axes to produce a certain number of transmission images for image reconstruction. Especially in the Cryo-TEM, which uses very thin, vitrified slices of samples of typically 50nm...

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Precision Drives for Electron Microscopy - 3

Precision Drives for Electron Microscopy Motion Solutions from PI Typically the drive requirements for 3, 4, 5 or 6 - dimensions of freedom are solved by stacked drives. But also a fully parallel kinematic drive in form of a miniature hexapod is available. Some examples for potentially suitable drives, below. Cryo-versions only on specific request:  P-752 High-Precision Nano-positioning Stage Piezo-flexure stage, capacitive sensors, repeatability: ±1nm, travel range to 35 μm, UHV compatible, nonmagnetic Solutions for Cryo-TEM Sample Vitrification With the Cryo-TEM sample vitrification,...

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Precision Drives for Electron Microscopy - 4

Precision Drives for Electron Microscopy © Ebystk temente.(PI) GmbH & Co. KG All contents, including texts, graphics, data etc., as well as their layout are subject to copyright and olher protective law's. Any copying, modi- hcation cr redistribution in whole or in parts is subject to a written permission of PI. Although the information in this document has been compiled with the greatest care, errors cannot be ruled out completely. Therefore, wre cannot guarantee for the information being complete, correct and up to date. Illustrations may differ from the original and are not binding. PI...

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