Precision Drives for Electron Microscopy Precision Drives for Positioning and Moving of Specimen in TEM, Scanning TEM, Cryo-TEM, SEM and for the Vitrification of Samples for Cryo-TEM Onto Metal Grids Physik Instrumente (PI) GmbH & Co. KG, Auf der Roemerstrasse 1, 76228 Karlsruhe, Germany Phone +49 721 4846-0, Fax +49 721 4846-1019, Email [email protected], www.pi.ws

Precision Drives for Electron Microscopy Electron Microscopy Applications for electron microscopy cover a broad spectrum from semiconductor inspection, through materials research to molecular biology research. In conventional TEM as well as in the newer Cryo-TEM, which was awarded the Nobel Prize in 2017, the samples have to be precisely nanopositioned with precision in an XYZ coordinate and then tilted around one axes to produce a certain number of transmission images for image reconstruction. Especially in the Cryo-TEM, which uses very thin, vitrified slices of samples of typically 50nm thickness,...

Precision Drives for Electron Microscopy Motion Solutions from PI Typically the drive requirements for 3, 4, 5 or 6 - dimensions of freedom are solved by stacked drives. But also a fully parallel kinematic drive in form of a miniature hexapod is available. Some examples for potentially suitable drives, below. Cryo-versions only on specific request:  P-752 High-Precision Nano-positioning Stage Piezo-flexure stage, capacitive sensors, repeatability: ±1nm, travel range to 35 μm, UHV compatible, nonmagnetic Solutions for Cryo-TEM Sample Vitrification With the Cryo-TEM sample vitrification, first...

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