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Ion Beam Profiler

Ion Beam Profiler
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Ion Beam Profiler Featuring:     Low Light CMOS High-Speed Camera Large, Customizable Microchannel Plate Simple Acquisition of Analog or Digital Images Immediate Feedback of Ion Loss and Optimization New Upgraded Design PHOTONIS has combined two of our superior detection and analysis technologies into a new digital ion beam profiling unit. The new Ion Beam Profiler combines a large Microchannel plate (up to 120mm) in a complete assembly with the PHOTONIS Nocturn, a high-resolution digital CMOS low-light camera which is immune to sudden light damage. Together these highly sensitive imaging components offer a detailed image of your instrument’s ion beam, allowing system designers to identify and correct any areas of ion loss that had previously been overlooked. This new diagnostic tool allows the instrument to be designed to maximize the amount of ions collected for a superior analysis. Tracing the Path Ion optics modeling software is often used to design and predict the ion path within a mass spectrometer. The conventional method for aligning an ion beam consists of scanning the beam over a Faraday cup or electron multiplier, integrating the current, and finding the settings which produce the highest signal. However, ion trajectories can be influenced by many factors which are not considered in the model. Efficiently transporting ions from the source through the mass filter is critical for maximizing instrument sensitivity. The new PHOTONIS Ion Beam Profiler can visualize the location of any charged particle (Ion, Electron, UV, photon or soft X-Ray), enabling the instrument designer to ensure all available signal ions are collected. The unit can capture images from the phosphor screen at up to 100 frames per second and store them on a PC for collaboration and comparison testing. A strobe trigger is available to synchronize the camera to a specific event. Versatile Applications The new Ion Beam Profiling unit can be used in wide range of applications, including ion optic model verification, Imaging TOF, VUV Spectroscopy and high energy physics as well as ion beam profiling. The unit can be custom-fit with a specific microchannel plate and electro-optic housing to fit your unique application. The information furnished is believed to be accurate and reliable, but is not guaranteed and is subject to change without notice. No liability is assumed by PHOTONIS for its use. Performance data represents typical characteristics as individual product performance may vary. Customers should verify that they have the most current PHOTONIS product information before placing orders. No claims or warranties are made as to the application of PHOTONIS products. Pictures may not be considered as contractually binding. This document may not be reproduced, in whole or in part, without the p

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PHYSICAL CHARACTERISTICS OF MCPS Quality Diameters Available: Center-to-Center Spacings Available: Pore Sizes Available: Bias Angles: Pixel Size: (H X V) Open Area Ratio: Varies by MCP used. Example: 75mm MCP results in 81 x 88 micrometers [0.0032 x 0.0034 inch] typical. 45% -65% depending on MCP configuration ELECTRICAL CHARACTERISTICS OF DETECTOR Electron Gain @ 2400 Volts Maximum: Bias Current Range @ 2400 Volts: 20-199 Microamps (For Reference Only) Dark Count: Pulse Height Resolution @ FWHM: Maximum Specified Operating Voltage (Across MCPs): Linear Output Current Density:...

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Ion Beam Profiler 2Pages

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Ion Beam Profiler
2Pages