UltraChem 40
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Catalog excerpts

UltraChem® 40 Liquid Particle Counter Highly reliable particle counter with 40 nm sensitivity for high molecular scatter applications Your products need reliable contamination monitoring. You need to detect the smallest particle possible. Now get both – sensitivity to 40 nm particles with the greatest reliability available on the market. If your application requires measuring small particles in chemicals with high molecular scatter, UltraChem® 40 is the best tool for the job. NanoVision Technology® eliminates the competition between the light scattered by fluid molecules and particles. This makes 40 nm sizing possible for the first time. Background and false counts are a thing of the past. The NanoVision Technology breakthrough ensures only information that matches a particle fingerprint is counted. The result: Data you can act on with confidence. BENEFITS Detect Small Particles • 40 nm sensitivity • Large sample volume for improved data quality NanoVision Technology® • Adaptive technology makes the instrument immune to most optical contamination • See what your particle counter sees • Measures small particles in a wide range of chemicals, including high molecular scattering fluids. Chemicals include: • PGMEA • Photoresist solvents • HF • Sulfuric acid Low Cost of Operation • 3-year warranty on Liquid Particle Counter 1-year warranty on Electronic Flow Controller • Solid state laser diode • Simple design Versatile • Online or batch sampling capabilities • Multiple communication protocols • Small footprint allows placement in various locations DI water monitoring (cold and hot) Chemical distribution monitoring Chemic

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UltraChem® 40 Liquid Particle Counter Size range Electronic Flow Controller Size channels Flow rate Sample volume Maximum concentration 2,500 particles/ml, Monitor and Spectrometer mode 15,000 particles /ml, High-Scatter mode Fluid temperature Sample temperature Fluid pressure Zero count Laser source Laser diode Class I, complies with US 21 CFR 1040.10 and EN 60825-1; Internally an enclosed Class 4 laser is used per EN 60825-1 Wetted materials RS-232 (maintenance functions only) Wetted surface materials Sapphire, Teflon®, Kel-F® Operating principle Ultrasonic flowmeter with active PID...

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