HSLIS e-Series Liquid Optical Particle Counter Provides continuous, real-time monitoring of contamination levels in DI water and process chemicals. The HSLIS e-Series (High Sensitivity Liquid In Situ) particle counter provides continuous, real-time monitoring of contamination levels in DI water and process chemicals. The combination of high sensitivity and low cost makes it ideal when large numbers of sensors and/or long term trending are required. The HSLIS e-Series has sizing sensitivity down to 0.05 µm in DI water and 0.065 µm in process chemicals. Integration of the HSLIS e-Series into Particle Measuring Systems’ Facility Net software provides an economical way to monitor multiple flow systems and provide dedicated local display and control capabilities. BENEFITS • Monitor for long term trends in fluid quality • Control and monitoring of multiple particle counters using Ethernet • Low initial capital investment and lower maintenance cost with proven reliability of the HSLIS design • Tabular and statistical process control (SPC) charts for detailed statistical information • Alphanumeric paging and e-mailing functions to alert operator of data excursions • Sensor status displays four-level alarm for monitoring out-of-spec condition • Simplified data interpretation with real-time and retrieved time plots 4 channels 0.05, 0.1, 0.15, 0.2 µm size range Operates with an optimal flow rate of 100 ml/min ± 10% Samples 0.25% of the flow volume or 0.25 ml/min Compatible with Facility Net software Existing network can be utilized with ethernet communication to Facility Net software Real-time particle monitoring within chemical distribution systems Point-of-process monitoring Chemical packaging operations monitoring Chemical filter performance and efficiency characterization Performance

HSLIS e-Series Liquid Optical Particle Counter Size range Channel sizes Flow rate Sample volume Counting efficiency Maximum concentration Sample temperature Zero count Wetted surface materials Delrin®, Kalrez® 4079, Kel-F®, Teflon®, Viton®, fused silica Kalrez 4079, Kel-F, Teflon, sapphire Kalrez 4079, Kel-F, Teflon, sapphire Materials used are traceable to US National Institute of Standards and Technology (NIST) and/or Japanese Institute of Standards (JIS). Temperature: 50 – 95 °F (10 – 35 °C); Humidity: non-condensing Ethernet, 4-20 mA (5 outputs; 4 particle channels, 1 instrument status) RS-232...