Atomic Force Microscopes

Head XY Scanner Base Technical Innovations Sensored, closed loop positioning for high resolution imaging, accuracy, and reproducibility. Pioneering all-digital controller for open software adaptability, power and flexibility. Built-in advanced features such as real-time 3D rendering, nanolithography/nanomanipulation, and Dual AC™ Mode for dual resonance and harmonic imaging. Designed for flexibility and expandability, with a wide range of available system, environmental and application options to enhance capabilities, including nanoindentation and Piezoresponse Force Microscopy (PFM). Please...

Designed by Scientists Who Understand the Demands of Your Research. Asylum Research was founded by scientists with the Roger Proksch Jason Cleveland Co-founders s imple goal of creating the world’s best research instrumentation f or other scientists. We offer the most technically advanced Atomic Force Microscopes for applications such as materials science, life science, polymers, nanolithography, electrical/ magnetic measurements, and nanoindenting. Asylum Research sets the bar for AFM performance. Personalized, Exceptional Support Once you begin your research, our staff scientists are here to...

Low noise, eliminates interference Sensored optical lever with diffraction limited optics and a low coherence light source virtually eliminates interference artifacts. The NPSTM sensored Z axis provides precise measurements of the cantilever position for accurate force and topography measurements. Piezo Position Sensitive Detector Flexure Hinge Light Path Cantilever Nanopositioning System (NPS) Sensor Mechanical Unfolding of Protein Recollimation Lens Cold Mirror Precision and accuracy unlike any tube scanner The MFP-3D uses a flexured scanner and patented NPS sensors which measure the exact...

Bottom View Objective To Cameras Three configurations for illuminating and viewing your sample • Top view for opaque samples • Bottom view for transparent samples • Dual view for both viewing options Fiber Port for Köhler Illumination All-Digital Controller and Software Flexibility All-digital configuration allows virtually the entire system operation to be controlled through the MFP software interface (IGOR Pro) for easy addition of new microscope capabilities. What Kind of User Are You? Built-in Features • ModeMasterTM - A library of standard and user-defined operation modes such as AC, Contact,...

Specications Operating Modes Contact Mode: Imaging using feedback on deflection. Height, deflection, and lateral force signals available. AC and Dual AC™: Q-controlled imaging using feedback on amplitude. Signals include height, amplitude/phase, I/Q, deflection; both air and fluid. Force Mode: Force curve acquisition in contact or AC mode. All signals available. Lateral Force: Frictional force imaging. MicroAngelo: Built-in nanolithography/ nanomanipulation. EFM, Surface Potential, Conductive AFM (CAFM) with ORCA™ (optional); Magnetic Force Microscopy (MFM), Variable Field MFM (optional); Piezoresponse...