The best place to start with Atomic Force Microscopy Performance – Expert Support – Closed-Loop – Affordable – Upgradable

The best place to start with Atomic Force Microscopy The MFP-3D Origin™ marks the intersection of performance and affordability in the Asylum Research MFP-3D™ AFM family. It features the technical excellence, innovation, and world-class customer support that is the trademark of every Asylum AFM that ships out our door. With full upgrade potential to the MFP-3D and its complete range of accessories, the MFP-3D Origin is simply the best place to start with atomic force microscopy. • The most affordable member of the MFP-3D family • Leading closed-loop AFM resolution and performance • Modes and...

What Can the MFP-3D Origin Do for You? Diverse applications, powerful results • Morphology and nanomechanics • Organization in blends and copolymers • Interface/interphase properties Microgel thin film, surface potential image, 15μm scan. Courtesy of C.D. Sorrell and L.A. Lyon, Georgia Institute of Technology. Thin Films Carbon nanotube attached to an electrode, EFM phase is overlaid on topography, 5 x 2.5μm scan. Courtesy of Minot Lab, Oregon State University. • Morphology and uniformity • Hardness and wear properties • Electrical conductivity • Storage and loss moduli Electronic Devices and...

LEADERSHIP Performance Runs in the Family MFP-3D Origin – where performance and affordability intersect Performance and modern features that go far beyond all competitors in its class. High-resolution imaging in both air and fluid • Robust mechanical design minimizes noise and drift in images • Digital controller architecture for fast, low noise operation • Accommodates large samples, up to 80mm diameter Most accurate, lowest-noise force measurements • Unique inverted optical lever design eliminates interference artifacts • Sensitivity limited only by the intrinsic thermal noise of cantilevers...

Flexibility Get Both Versatility and Productivity Software that will help get you started and will never hold you back Get your results faster with SmartStart and ModeMaster Included Modes • Contact Mode • Lateral Force Mode (LFM) • AC Mode (Tapping Mode) • Phase Imaging • Dual AC™ • MicroAngelo (nanolithography/ nanomanipulation) SmartStart™ auto detects and configures system components to get started fast • ModeMaster™ configures the software for your choice of measurement type Many advanced features are included at no extra charge powerful MicroAngelo™ • Includesfor nanomanipulation and feature...

innovatioN Empower Your Research Asylum Research – the technology leader in AFM The MFP-3D Origin benefits from years of ongoing innovation at Asylum Research. NanomechPro™ Toolkit • Powerful suite of tools for nanomechanical characterization • Fast, high-resolution and quantitative material property mapping to choose the best method and mechanical model • Flexibility accurate results over the widest range of samples for the most • Obtain quantitative values for elastic modulus, loss modulus, stiffness, dissipation, adhesion and more Leadership in Piezoresponse Force Microscopy • Asylum Research...

Performance Best in Class System Specifications Guaranteed. Tested. Delivered. High-precision, low-noise scan motion, and closed-loop operation in all three axes X&Y Range 90µm X&Y Sensors <0.5nm noise, <0.5% non-linearity (max deviation/full travel) Z Range >15µm (Extended range Z option >40µm) Z Sensor <0.25nm noise, <0.05% non-linearity (max deviation/full travel) Lowest-noise force measurements limited only by inherent thermal noise limit Cantilever Deflection Sensing Optical lever in an inverted configuration (incident beam off-vertical) to dramatically reduce interference from light reflected...

Support Unmatched Customer Support We help you get the results you need “ sylum Research … proves every day how much they A care about their customers by providing the best service and support in the industry. Truly exceptional.” Personalized, exceptional support • Free support from our worldwide technical staff allows • OnSight Remote Supportover theus to control and diagnose your AFM internet – Scott MacLaren, University of Illinois at Urbana-Champaign Forum has almost 3,000 • Online User lively technical discussionsmembers engaged in Much more than just technical support of • Our AFM experts...