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Wafer and PCB control with Opto's 'Machine Vision Microscopes' (1 page)

Wafer and PCB control with Opto's 'Machine Vision Microscopes' (1 page)
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Wafer and PCB control with Opto's 'Machine Vision Microscopes' (1 page) - 1

Test & Measurement / Semicon Electronics Wafer and PCB Control with Opto’s ‘Machine Vision Microscopes’ Customer Task: Rework, failure analysis and documentation Optical quality control of IC`s, FPGA`s,BGA`s Single-sided, double-sided, or multilayer PCB inspection. Finding cracks, short circuits, defect electrical connections, bridges Optical post bond inspection or post reflow inspection Automatic pin counts, pin distance control, components identification Fast image acquisition with highest resolution Finding irregularities in wafer coating, impurities, cracks or misalignment anomalies Identifying contaminations, particles, scratches, or structure analysis Different Imaging Modules like compact M, linea XL available Monochrome and color version Application optimized Optoelectronics Easy to use and free OptoViewer 2.0 software Image Processing Plug Ins available Different SDK and toolkits for machine Integration available USB 3.0 / GigE available – Plug and Play Pure all in one digital microscope More compact than regular microscopes Highest image quality with good color repeatability Optimized for mobile use Reliable Image Data Highest Price – Quality ration Software support 07/2022 - Design and technical development are subject to change without notice. © Opto GmbH | TM_SE_IC_22-07.1 Fig. 1: Defect identification using different illuminatio

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