Test & Measurement / Semicon Electronics Wafer and PCB Control with Opto’s ‘Machine Vision Microscopes’ PCB Inspection – find soldering defects Testing IC,s FPGA chips, Ball Grid Arrays (BGA) Semiconductor Inspection Fast image acquisition DIC (Differential Interference Contrast) High resolution, optimal contrast with the Opto SDK they control their software Imaging Module IM•compact M Monochrome or colour version Easy to use and free OptoViewer 2.0 software Image Processing Plug Ins available Integrated transmission illumination Direct measurement without calibration USB 3.0 / GigE available – Plug and Play Pure all in one digital microscope More compact than regular digital microscope Highest image quality with huge color repeatability Optimized for mobile use Easy machine integration Ultra compact design Fig. 1: Defect identification using different illumination concepts – brightfield (left) vs. dark field (right) 07/2022 - Design and technical development are subject to change without notice. © Opto GmbH | TM_SE_IC_22-07.1 www.opto-gmbh.com Opto GmbH • Floriansbogen 2/4 • 8206