Application note Test & Measurement / Materialography Customer-Task: • Grain & Structure Analysis of Metals • Predictive Maintenance of production processes • Quality control of mechanical parts • Damage evaluation of metal malfunction Solution: • Imaging Module compact M (MVM) • Small footprint with portable stand and case • Easy to use and free SW OptoViewer 2.0 software • Ring- and Coaxial Illumination integrated • Direct measurement without calibration • USB one cable solution Link: Article Advantage for customer: • Pure all in one digital microscope • Micrometer / pixel Resolution with large FoV • High Contrast and Color stability • Repeatability of Image • Open SW architecture • Easy machine integration • Bright and Darkfield in one unit 02/2022 | Design and technical development are subject to change without notice. | © Opto GmbH | TM_M_SA_IC_22-01.1