Predictive Quality Control / solino Application note G£>to100-SO-10-MAN-001 Electronic Components Anomaly Opto solino RTI sensor Detecting micro defects using BRDF computational imaging Customer Task: Modern electronic assemblies rely on highly precise semiconductor packages and solder connections. Components such as BGA packages, processors and high-density electronic modules must meet extremely strict quality standards to ensure reliable electrical performance and long-term durability. Manufacturers require reliable inspection methods for: • solder ball arrays on BGA packages • semiconductor chip packages • contact pads and electrical interfaces • microelectronic surface structures • contamination or foreign particles on packages The goal is to detect surface defects early in the production process and ensure consistent quality across all electronic components before assembly. Inspecting semiconductor packages and BGA solder arrays presents several challenges for conventional machine vision systems. Typical challenges include: • highly reflective solder balls • dense micro-scale structures • small defects difficult to detect under fixed illumination • contamination or oxidation on contact surfaces • variations in solder ball shape or height Standard camera systems rely on fixed lighting conditions and often struggle with reflective metallic surfaces such as solder balls. Glare and reflections can hide defects or produce unreliable inspection results. As a result, certain defects may remain unnoticed until later stages of the production process. Fig. 2: 100-SO-10-MAN-001 solino 10x10 - Viewer + Stand Opto GmbH • Floriansbogen 2/4 • 82061 Neuried • Germany • Tel: +49 89 8980 55 0 • [email protected]
Open the catalog to page 1Technology Principle The solino RTI sensor uses BRDF-based computational imaging to reveal surface structures. Within milliseconds the system captures a series of images under different illumination angles and reconstructs the surface reflectance information computationally. • photometric stereo image capture • reflectance-based surface reconstruction • computational defect enhancement This approach creates a stable and repeatable inspection environment independent of external lighting conditions. Using controlled mul6-direc6onal illumina6on, solino enhances the visibility of surface anomalies...
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