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Introduction to Scanning-Slit Profilers

Introduction to Scanning-Slit Profilers
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Introduction to Scanning-Slit Profilers - 1

3.3 Introduction to Scanning-Slit Profilers The scanning slit beam profiler moves two narrow orthogonal slits in front of a linear photo-detector through the beam under analysis. Light passing through the slit induces a current in the detector. Thus, as the slit scans through the beam, the detector signal is linearly proportional to the spatial beam irradiance profile integrated along the slit. A digital encoder provides accurate slit position. The photoinduced current signal is digitized and analyzed to obtain the beam profile in both X and Y from the two orthogonal slits. The slit apertures act as physical attenuators, preventing detector saturation for most beam applications. High dynamic range amplification allows operation over many orders of magnitude in beam power. From these profiles, important spatial information such as beam width, beam position, beam quality, and other characteristics are determined. This technique can accommodate a wide variety of test conditions. Because slit scanners measure beams at high powers with little or no attenuation, they are ideal to profile beams used in material processing. 3.3 Beam Profile Carbon dioxide (CO2) lasers are widely used in materials processing, and have a 10.6 micron wavelength that cannot be profiled with most cameras. Slit scanners, therefore, provide an convenient means of measuring high-resolution CO2 lasers with powers up to and exceeding 1000 watts. 148 12.07.2012 For latest updates please visit our website: www.ophiropt.com/photonics

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Introduction to Scanning-Slit Profilers - 2

3.3.1 NanoScanTM Scanning Slit Beam Profiler For High Accuracy Dimensional Measurement NanoScan is a PC-based instrument for the measurement and analysis of optical beam spatial profiles in accordance with ISO standards. Beam profiles are measured using the International Standard ISO 11146. Scanheads that are fitted with an optional power feature can measure power in accordance with ISO 13694. The system comprises a scanhead for sensing the laser beam, a USB 2.0 controller, and NanoScan software. An optional automation feature includes an ActiveX automation server. NanoScan uses moving...

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Introduction to Scanning-Slit Profilers - 3

NanoScan Main Display Screen File Menu Quick Access Toolbar Panel Title Bar Ribbon Bar 3.3.1 Beam Profile Ribbon Tabs Results Window User Notes Status Bar Primary Dock Window (note tabs) The Most Versatile and Flexible Beam Profiling System Available Photon’s NanoScan scanning slit profilers provide major performance enhancements while maintaining the ease-of-use and flexibility that customers have come to expect with its predecessor, the world-renowned BeamScan. NanoScan scanheads are available to measure CW and pulsed beams across the entire spectral range from UV to far infrared. 150...

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Introduction to Scanning-Slit Profilers - 4

See Your Beam As Never Before The Graphical User Interface (GUI) of NanoScan is new. Dockable and floatable windows plus concealable ribbon tool bars empower the NanoScan user to make the most of a small laptop display or a large, multi-monitor desktop PC. Simple docked view Both docked and undocked windows From 1989 through 1996, John Fleischer, past President of Photon Inc., chaired the working laser beam width ISO/DIN committee that resulted in the ISO/DIN 11146 standard. The final approved standard, available in 13 languages, is a compromise based on many years of work by the committee....

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Introduction to Scanning-Slit Profilers - 5

Multiple Beam Analysis Software The NanoScan software is an integrated package for Microsoft Windows operating systems, it can measure from one to 16 beams in the NanoScan aperture, all with sub-micron precision. The optimal-pro software includes ActiveX automation for users who want to integrate the NanoScan into OEM systems or write their own user interface screens. M² Wizard M-squared (M²) software Wizard is an interactive program for determining the “times diffraction limit” factor M² by the Rayleigh Method. The M² Wizard prompts and guides the user through a series of manual...

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Introduction to Scanning-Slit Profilers - 6

Optional Automation Interface The Pro model scanheads implement an Automation Server that can be used by an Automation Client written in Visual Basic for Applications (VBA), C/C++ or by an application with support for ActiveX Automation, such as Microsoft Excel, Microsoft Word or National Instruments’ LabVIEW. Optional Collimation Fixture Full featured application examples are included to help your learning curve when embedding NanoScan - PRO into an automation application Divergence/Collimation test fixtures based on a high quality test lens to focus your collimated or diverging beam....

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Introduction to Scanning-Slit Profilers - 7

NanoScan Configurations Detector Type Power Range Wavelength Aperture Slits Scanhead Size Silicon ~100nW-~100mW 190nm-950nm 3.5mm 1.8µm 63mm 9mm 5µm 63mm 25µm 25mm ~1µW-~100mW 700nm-1800nm 100mm 3.5mm 1.8µm 63mm 9mm Germanium 25µm 5µm 63mm 25µm 12mm Pyroelectric 100mW-100W 200nm- >2.0µm 25µm 100mm 9mm 5µm 63mm 25mm 20mm 25µm 100mm The power that can be handled by the NanoScan is dependent on the wavelength of the light to be measured. The wavelength of light determines both its reflectivity from the slit surfaces and the energetic nature of the interactions with materials. As a rule of...

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Introduction to Scanning-Slit Profilers - 8

NanoScan Acquisition and Analysis Software *Feature NanoScan Standard NanoScan Professional (all features in Standard plus) Controls Source Capture Regions of Interest (ROI) Profiles Computation: ISO 13694, ISO 11146 2D/3D Charts Logging M² Views Profiles Results Pointing Charts 2D/3D M² Wizard Continuous, Rolling, Finite Centroid or Peak, Accumulate Mode, Beam Indicator, Graph Center, Colors 2D or 3D Mode, Linear or Logarithmic Scale, Resolution, Fill Contours, Solid Surface, or Wireframe, Clip Level Colors Chart Select, Parameter Select, Aperture Select, Update Rate, Start and Clear File...

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Introduction to Scanning-Slit Profilers - 9

Ordering Information - NanoScan Systems Both -STD & -PRO NanoScan Systems Include: NanoScan v2 Integrated Software package for use with NanoScan scanheads under Microsoft Windows operating systems. ActiveX automation is provided in -PRO models. Certificate of Calibration. Beam width is traceable to National Institute of Standards and Technology (NIST) to better than ±2% (NanoScan Pyroelectric detectors calibration to better than ±3%). Item USB NS-Si/3.5/1.8-STD USB NS-Si/3.5/1.8-PRO USB NS-Si/9/5-STD USB NS-Si/9/5-PRO USB NS-Si/9/25-STD USB NS-Si/9/25-PRO USB NS-Si/25/25-STD 3.3.1 Beam...

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