* 4 site x 8 input / output channels, IO dynamically configurable * 32 M of on-board vector memory per channel Features The QSPI represents a multi-function of performance and capabilities for PXI-based digital instrumentation. The QSPI offers high performance pin electronics and 4 I2C masters and 4 32bit counter 4 clock generator in a compact, 3U PXI form factor. Each card can function as a quad sites I2C/SPI device tester, multiple cards can be interconnected, supporting up to 64 sites. The QSPI also supports deep pattern memory by offering 32M of onboard vector memory with dynamic per pin direction control and with test rates up to 10 MHz. The QSPI supports -1 ~ +10 VOH VOL VIH VIL per channel and 32 PMU per board. The QSPI offers 1 timing set, 2 driver TG Edges, 2 strobe TG Edges and four drive data formats are supported. RTZ (Return To Zero), RTO (Return To One), NRZ (Non Return To Zero), SBC (Surround By Complement) which can provide flexibility to create a variety of bus cycles and waveforms to test board and box level products. The QSPI offers 32 M of vector memory per site. Programmable pattern cycle times up to 232 or infinite. There are pattern symbols including 0, 1, L, H, X, Z, J, The QSPI is supplied with API and Pattern Editor. Pattern Editor is a software tool that edits test patterns. Compatibility All OpenATE Interfaces PXI cards comply with the PXI Specification 2.0 (issued Aug. 2000) Application Automatic Test Equipment(ATE) Consumer Digital Functional Test Digital Pattern Generation I2C salve Device Testing

The Open Solution for IC Tester 5F-17, 5F., No.5, Sec.5, Xinyi Rd., Taipei City, Taiwan Copyright © OpenATE Inc., All rights reserved. Specifications subject to change without notice.