* 32 input / output channels, dynamically configurable * 32 M of on-board vector memory per channel * Supports 4 Timing Sets & 4 Format Sets change on the * Dynamic controlled sequencer uses micro-instructions including Match, Repeat * Quad Sites Pattern Mode * 4 Serial port function support 52MHz MIPI2.0 RFFE * Switchable reference clock 200/208MHz The PE32H offers 32 M of vector memory per channel. Programmable pattern cycle times up to 232 or infinite. There are pattern symbols including 0, 1, L, H, X, Z, J, The PE32H represents a new level of performance and capabilities for PXI-based digital instrumentation. Based on the proven architecture of the PE32, the PE32H offers high performance pin electronics and an enhanced timing generator in a compact, 3U PXI form factor. Each card can function as a stand-alone digital subsystem or if required, multiple cards can be interconnected, supporting up to 256 bi-directional pins (8 boards). The PE32H also supports deep pattern memory by offering 32M of on-board vector memory with dynamic per pin direction control and with test rates up to 66 MHz. With new 32M log memory, PE32H can capture 32 channels data or fail log . The PE32H is supplied with API and Pattern Editor. Pattern Editor is a software tool that edits test patterns. The PE32H supports -1 ~ +7 VOH VOL VIH VIL per channel and 4 PMU per board. The PE32H offers 4 timing sets, 2 driver TG Edges, 1 strobe TG Edges. 4 Format sets, change on the fly, and four drive data formats are supported: RTZ (Return To Zero), RTO (Return To One), NRZ (Non Return To Zero), SBC (Surround By Complement) which can providing flexibility to create a variety of bus cycles and waveforms to test board and box level products. One 200MHz 32bit counter for frequency measurement. Quad sites mode can run 32 ch pattern as 4 site 8 ch pattern . All OpenATE Interfaces PXI cards comply with the PXI Specification 2.0 (issued Aug. 2000) Automatic Test Equipment(ATE) Consumer Digital Functional Test Digital Pattern Generation Hybrid and Digital IC Testing

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