Introduction
The document describes the OBLF VeOS Spark Emission Spectrometer, which utilizes advanced semiconductor detector technology for emission spectroscopy. It is designed for versatile and rapid analysis of metallic materials, including precise analysis of short-wave elements such as sulfur, phosphorus, nitrogen, and carbon in steel or cast iron, and phosphorus in aluminum.

Key Features

• First spark spectrometer with semiconductor-based detector system offering performance comparable to photomultiplier-based systems.
• Light-sensitive detectors with a surface 100 times more sensitive than conventional systems.
• Wavelength range of 130 to 780 nm, ensuring excellent results across the required spectrum.
• Operator-friendly design suitable for production environments, goods receipt, materials control, and test labs.

Benefits

• Complete and flexible inclusion of all analytical tasks.
• Easily extendable applications.
• Excellent performance in detection limit, precision, and stability.
• Robust design for heavy-duty environments.
• Comprehensive multi-matrix application options without restrictions on element selection.
• Accurate detection of nitrogen and traces of carbon (ULC).

Technical Specifications

• Optical System: Paschen-Runge line up, temperature stabilized to +5°C, resolution 7 pm/Pixel.
• Vacuum System: Automatic vacuum control, oil-free optical system, optimized for low Ar consumption.
• Spark Stand: Patented self-cleaning function, digital Ar flow control, maintenance-free.
• Spark Generator: Digital, fully semiconductor-based control, spark frequency up to 1000 Hz.
• Dimensions & Weight: 74 x 134 x 115 cm, approx. 300 kg.

Software and Operation
The spectrometer is equipped with Windows-based software, OBLFWin, which allows for simple operation and includes settings for spark spectroscopy, type calibration, device monitoring, and automatic program selection. The integrated SpectrumAnalyser enables easy extension of emission lines or matrices, and the line profile or complete emission spectrum can be displayed for qualitative information.

Conclusion
The OBLF VeOS Spark Emission Spectrometer offers a combination of spectral sensitivity, resolution, and innovative design, ensuring high-quality analysis and flexibility for various applications.