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XT V Series
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Catalog excerpts

XT V Series - 1

X-ray and CT technology for electronics inspection NIKON METROLOGY I VISION BEYOND PRECISION

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XT V Series - 2

ELECTRONICS INSPECTION MADE EASY There is an increasing demand for flexible, high-resolution and cost-effective X-ray inspection systems to cope with the evolution of ever-shrinking geometries within electronics components and to comply with tighter quality standards. The XT V series enable insights into printed circuit board assemblies, components, or electrical devices in an intuitive, non-destructive inspection process. X-ray inspection provides many benefits to manufacturers and researchers, accelerating throughput and improving product quality whilst reducing costs.

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XT V Series - 3

With the constant demand for component miniaturization and 3D packaging technologies, modern X-ray inspection systems must provide the sharpest images and a vast range of applications in order to increase productivity. Wafer level interconnectivity: WLFP or WL-CSP, 3D packaging, System in Package (SiP) Ball bond Besides electronics inspection, XT V systems are also suited for X-ray and CT inspection of a wide variety of smaller components. The large tray can hold different samples for serial NDT analysis: Micro-Electro-Mechanical Systems (MEMS, MOEMS) often used in consumer electronics such...

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XT V Series - 4

Nikon Metrology X-ray sources are the core of our technology and are designed and manufactured in-house. This allows Nikon Metrology to quickly move with the market and develop complete and innovative solutions to the application demand. Key benefits include low cost of ownership, lower maintenance and higher reliability through open tube design. The integrated voltage generator eliminates the need for a high voltage cable assembly that requires regular maintenance.

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XT V Series - 5

WITH INHERENT PRECISION The XT V systems are supplied with a highly accurate sample manipulator with an optional precision CT rotate axis. The vertical system configuration, with the X-ray tube below the sample holder and the tilting imager is controlled through userfriendly Inspect-X software or via precise joystick manipulation. Capable of multiple rotations even at maximum tilt, the rotate table of the premium XT V 160 provides helicopter fly-around views of any region of interest even at maximum magnification. 0° Tilt angles up to 75° offers sufficient flexibility to trace connectivity...

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XT V Series - 6

PREMIUM QUALITY XT V 160 – Premium X-ray inspection Specifically designed for use in production lines and failure analysis laboratories, the XT V 160 can be configured with a choice of premium system components to optimize the performance for your needs. Besides manual real-time inspection, the inspection process can be fully automated to maximize productivity. • Proprietary NanoTech 160 kV / 20 W microfocus source with submicron feature recognition • 1.45 Mpixel 12bit camera with dual field 4”/6” image intensifier • Optional flat panel detector • 5-axis manipulator (X,Y,Z, Rotate, Tilt) •...

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XT V Series - 7

AND ECONOMICS XT V 130C - Cost-effective X-ray inspection The XT V 130C is a highly flexible and cost-effective electronics and semiconductor inspection system. The system features a 130 kV/10 W Nikon Metrology manufactured source, a globally recognized open tube design with integrated generator, and a highresolution imaging chain. A series of optional factory or field upgrades enable the users to configure the system to their own requirements and budget. Upgrades include a sample rotation stage, a high definition digital flat panel option, automated inspection software and CT technology •...

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XT V Series - 8

Interactive and user-friendly software is essential in evaluating the complex internal structures, performing accurate inspection, providing defect recognition with confidence. Inspect-X has been designed around the user experience, resulting in intuitive and productive X-ray inspection. Inspect-X features user friendly wizards to guide users through complex inspections, as well as utilizing the most advanced visualization and analysis function capabilities. XT V systems with Inspect-X enable rapid deployment of new product lines, within minutes, rather than hours or days. INSPECT-X CONTROL...

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XT V Series - 9

WITH ADVANCED ANALYSIS IMAGE ANALYSIS AND ENHANCEMENT Making real-time correct decisions requires crystal-clear and sharp images. The C.Clear real-time image engine enables operators to identify defects with confidence without time consuming image enhancements. C.Clear intelligently adapts to changing X-ray conditions and sample positions, automatically adjusting image controls, contrast and brightness in order to provide the clearest and sharpest images to aid in defect recognition. • Real-time enhancements and filters stored as user profiles to suit different sample types or individual...

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XT V Series - 10

Inspection Report - PC'BA Inspection Inspect-X provides a suite of easy-to-use tools and customizable HTML templates for endless real-time or automated reporting possibilities. Reports can be easily shared with colleagues or suppliers to facilitate decision-making. Results are available for offline analysis and troubleshooting on validation station.

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XT V Series - 11

FOCUSING ON PRODUCTIVITY Operating in automated inspection mode, the XT V combined with Inspect-X is a productive X-ray solution for repeated inspection of PCBAs, semiconductor components and complex high density boards. Creation and execution of inspection routines is straightforward, utilizing the graphical interface or teach and learn. Users requiring detailed insight of (multi-layer) electronic components can benefit from the X.Tract or Computed Tomography functionality for a full 3D view of internal structure. Intuitive icons help the user to interactively build an automated inspection...

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XT V Series - 12

NIKON METROLOGY, INC. Tel: +1 810 2204360 Sales.US.NM@nikon.com NIKON METROLOGY UK LTD. Tel: +44 1332 811349 Sales.UK.NM@nikon.com NIKON CORPORATION Shinagawa Intercity Tower C, 2-15-3, Konan, Minato-ku, Tokyo 108-6290 Japan Tel: +81-3-6433-3701 Fax: +81-3-6433-3784 www.nikon.com/products/industrial-metrology/ NIKON INSTRUMENTS (SHANGHAI) CO. LTD. Tel: +86 21 5836 0050 Tel: +86 10 5869 2255 (Beijing office) Tel: +86 20 3882 0550 (Guangzhou office) NIKON SINGAPORE PTE. LTD. Tel: +65 6559 3618 ISO 14001 Certified for NIKON CORPORATION ISO 9001 Certified for NIKON CORPORATION Microscope...

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