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Catalog excerpts
![XT V SERIES - 1](https://img.directindustry.com/pdf/repository_di/21023/xt-v-series-1074451_1m.jpg)
X-ray and CT technology for electronics inspection
Open the catalog to page 1![XT V SERIES - 2](https://img.directindustry.com/pdf/repository_di/21023/xt-v-series-1074451_2m.jpg)
Electronics inspection made easy A wealth of applications With the constant demand for component miniaturization and 3D packaging technologies, modern X-ray inspection systems must provide the sharpest images and a vast range of applications in order to increase productivity. There is an increasing demand for flexible, high-resolution and cost-effective X-ray inspection systems to cope with the evolution of ever-shrinking geometries within electronics components and to comply with tighter quality standards. The XT V series enable insights into printed circuit board assemblies, components,...
Open the catalog to page 2![XT V SERIES - 3](https://img.directindustry.com/pdf/repository_di/21023/xt-v-series-1074451_3m.jpg)
At the core of X-ray technology With inherent precision Nikon Metrology X-ray sources are the core of our technology and are designed and manufactured in-house. This allows Nikon Metrology to quickly move with the market and develop complete and innovative solutions to the application demand. The XT V systems are supplied with a highly accurate sample manipulator with an optional precision CT rotate axis. Key benefits include low cost of ownership, lower maintenance and higher reliability through open tube design. The integrated voltage generator eliminates the need for a high voltage cable...
Open the catalog to page 3![XT V SERIES - 4](https://img.directindustry.com/pdf/repository_di/21023/xt-v-series-1074451_4m.jpg)
PREMIUM X-RAY INSPECTION COST-EFFECTIVE X-RAY INSPECTION Specifically designed for use in production lines and failure analysis laboratories, the XT V 160 can be configured with a choice of premium system components to optimize the performance for your needs. Besides manual real-time inspection, the inspection process can be fully automated to maximize productivity. The XT V 130C is a highly flexible and costeffective electronics and semiconductor inspection system. The system features a 130 kV/10 W Nikon Metrology manufactured source, a globally recognized open tube design with integrated...
Open the catalog to page 4![XT V SERIES - 5](https://img.directindustry.com/pdf/repository_di/21023/xt-v-series-1074451_5m.jpg)
Real-time inspection with advanced analysis Interactive and user-friendly software is essential in evaluating the complex internal structures, performing accurate inspection, providing defect recognition with confidence. Inspect-X has been designed around the user experience, resulting in intuitive and productive X-ray inspection. Inspect-X features user friendly wizards to guide users through complex inspections, as well as utilizing the most advanced visualization and analysis function capabilities. XT V systems with Inspect-X enable rapid deployment of new product lines, within minutes,...
Open the catalog to page 5![XT V SERIES - 6](https://img.directindustry.com/pdf/repository_di/21023/xt-v-series-1074451_6m.jpg)
Insightful reporting Focusing on productivity Operating in automated inspection mode, the XT V combined with Inspect-X is a productive X-ray solution for repeated inspection of PCBAs, semiconductor components and complex high-density boards. Creation and execution of inspection routines is straightforward, utilizing the graphical interface or teach and learn. Users requiring detailed insight of (multi-layer) electronic components can benefit from the X.Tract or Computed Tomography functionality for a full 3D view of internal structure. Intuitive icons help the user to interactively build an...
Open the catalog to page 6![XT V SERIES - 7](https://img.directindustry.com/pdf/repository_di/21023/xt-v-series-1074451_7m.jpg)
Max kV Max. electron beam power X-ray source Open tube transmission target Focal spot size 1,2 Feature recognition Geometric magnification System magnification Imaging system Varex 2520DX (2.85 Mpixel, 16-bit) Flatpanel Varex 1515DX (1.3 Mpixel, 16-bit) Flatpanel Varex 1313DX (1 Mpixel, 16-bit) Flatpanel Manipulator Rotate axis Tilt Measuring volume Largest square in single map 406 x 406 mm (16 x 16”) Maximum physical sample size 711 x 762 mm (28 x 30”) Radiation safety <1 μSv/hr at the cabinet surface Inspect-X control and analysis software Automated inspection Computed Tomography /...
Open the catalog to page 7All Nikon Metrology catalogs and technical brochures
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XT H 225 ST 2x
7 Pages
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VOXLS 30 SERIES
15 Pages
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XT H Series
7 Pages
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APDIS Automotive
7 Pages
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MCT225 Metrology CT
4 Pages
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Industrial X-ray and CT
7 Pages
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NEXIV VMZ-S
5 Pages
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bw series
8 Pages
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automated ct
8 Pages
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Autocollimator
4 Pages
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X-ray CT inspection services
1 Pages
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Overview brochure
40 Pages
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NEXIV VMZ-K Series
5 Pages
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NEXIV VMZ-H3030
3 Pages
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NEXIV VMZ R-Series
7 Pages
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Microscope components
17 Pages
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Laser Radar Aerospace
6 Pages
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CMM-Manager for iNEXIV
4 Pages
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CAMIO8
16 Pages
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ALTERA CMM
8 Pages
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CMM-Manager
8 Pages
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Newsmagazine Vol.13
28 Pages
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MCAx-MM
8 Pages
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LC60Dx
4 Pages
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LC15Dx
8 Pages
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NWL200
5 Pages
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Eclipse MA200-MA100N
12 Pages
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Eclipse LV-N Microscopes
9 Pages
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XT V Series
12 Pages
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VMZ-R Series
7 Pages
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MM-Series
15 Pages
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Stereo microscopes
32 Pages
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AZ100M-AZ100
20 Pages
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NIS-Elements
20 Pages
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Laser Radar General
6 Pages
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XC65Dx(-LS)
2 Pages
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Digital sight series
9 Pages
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L100 Laser scanner
8 Pages
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Nikon Metrology Solutions
40 Pages
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Profile Projectors
12 Pages
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XT H Series
12 Pages
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Automated CT
8 Pages
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Configurable X-ray CT systems
12 Pages
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Focus
6 Pages
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iNEXIV VMA series
5 Pages
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K-Scan MMDx - K-CMM
4 Pages
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JEOL Smart Coater
2 Pages
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JCM 6000 Plus Neoscope
16 Pages
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iSpace Assembly Fabrication
4 Pages
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iSpace
6 Pages
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H14L
4 Pages
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eclipse E200pol
3 Pages
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Auto MeasureEyes
2 Pages
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gehl-kseries
2 Pages
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BW-Series
8 Pages
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X.Tract
2 Pages
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Nikon Metrology News Vol.10
28 Pages
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Nikon Metrology News Vol.9
28 Pages
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LV100N POL Ci POL
5 Pages
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LV-DAF Brochure
2 Pages
Archived catalogs
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NEXIV VMR Brochure
5 Pages
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Intensilight Brochure
3 Pages
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Eclipse L200 Series
5 Pages
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Eclipse LV Series Brochure
10 Pages
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Eclipse LV100-UDM-POL
3 Pages
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Neoscope JCM-6000 Brochure
6 Pages
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K-Robot
2 Pages
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LC15 Optical Probe
2 Pages
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XC50-LS Cross Scanner
2 Pages
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stereomicroscope SMZ1000
7 Pages
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Neoscope Brochure
4 Pages
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Optistation-3100
2 Pages
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AMI-3000
2 Pages
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COOLSCOPE
8 Pages
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BioStation IM
5 Pages
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BioStation CT
8 Pages
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Neoscope Brochure
4 Pages
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DXM-1200C
6 Pages
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Optistation-3100
2 Pages
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AMI-3000
2 Pages
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Eclipse FN1
7 Pages
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Eclipse E100 Brochure
5 Pages
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Fluorescence Filter Blocks
6 Pages
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Eclipse 50i/55i Accessories
5 Pages
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Laser TIRF System
7 Pages
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Eclipse TS100/TS100F
8 Pages
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Eclipse Ti Brochure
15 Pages
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Eclipse TE2000 Brochure
28 Pages
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COOLSCOPE
8 Pages
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BioStation IM brochure
5 Pages
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BioStation CT brochure
8 Pages