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XT V SERIES

XT V SERIES
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X-ray and CT technology for electronics inspection

Electronics inspection made easy A wealth of applications With the constant demand for component miniaturization and 3D packaging technologies, modern X-ray inspection systems must provide the sharpest images and a vast range of applications in order to increase productivity. There is an increasing demand for flexible, high-resolution and cost-effective X-ray inspection systems to cope with the evolution of ever-shrinking geometries within electronics components and to comply with tighter quality standards. The XT V series enable insights into printed circuit board assemblies, components,...

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At the core of X-ray technology With inherent precision Nikon Metrology X-ray sources are the core of our technology and are designed and manufactured in-house. This allows Nikon Metrology to quickly move with the market and develop complete and innovative solutions to the application demand. The XT V systems are supplied with a highly accurate sample manipulator with an optional precision CT rotate axis. Key benefits include low cost of ownership, lower maintenance and higher reliability through open tube design. The integrated voltage generator eliminates the need for a high voltage cable...

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PREMIUM X-RAY INSPECTION COST-EFFECTIVE X-RAY INSPECTION Specifically designed for use in production lines and failure analysis laboratories, the XT V 160 can be configured with a choice of premium system components to optimize the performance for your needs. Besides manual real-time inspection, the inspection process can be fully automated to maximize productivity. The XT V 130C is a highly flexible and costeffective electronics and semiconductor inspection system. The system features a 130 kV/10 W Nikon Metrology manufactured source, a globally recognized open tube design with integrated...

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Real-time inspection with advanced analysis Interactive and user-friendly software is essential in evaluating the complex internal structures, performing accurate inspection, providing defect recognition with confidence. Inspect-X has been designed around the user experience, resulting in intuitive and productive X-ray inspection. Inspect-X features user friendly wizards to guide users through complex inspections, as well as utilizing the most advanced visualization and analysis function capabilities. XT V systems with Inspect-X enable rapid deployment of new product lines, within minutes,...

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Insightful reporting Focusing on productivity Operating in automated inspection mode, the XT V combined with Inspect-X is a productive X-ray solution for repeated inspection of PCBAs, semiconductor components and complex high-density boards. Creation and execution of inspection routines is straightforward, utilizing the graphical interface or teach and learn. Users requiring detailed insight of (multi-layer) electronic components can benefit from the X.Tract or Computed Tomography functionality for a full 3D view of internal structure. Intuitive icons help the user to interactively build an...

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Max kV Max. electron beam power X-ray source Open tube transmission target Focal spot size 1,2 Feature recognition Geometric magnification System magnification Imaging system Varex 2520DX (2.85 Mpixel, 16-bit) Flatpanel Varex 1515DX (1.3 Mpixel, 16-bit) Flatpanel Varex 1313DX (1 Mpixel, 16-bit) Flatpanel Manipulator Rotate axis Tilt Measuring volume Largest square in single map 406 x 406 mm (16 x 16”) Maximum physical sample size 711 x 762 mm (28 x 30”) Radiation safety <1 μSv/hr at the cabinet surface Inspect-X control and analysis software Automated inspection Computed Tomography /...

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