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XT H Series

XT H Series
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ADVANCED INDUSTRIAL X-RAY AND CT

A wide range of applications X-ray computed tomography (CT) has been used for many years in laboratories to nondestructively inspect the interiors of samples such as fossils and ancient artifacts. There are compelling reasons for this academic and R&D interest: CT can detect voids, cracks, burrs, and other imperfections inside parts and assemblies without destruction. Now, this valuable technology is increasingly being introduced on the factory floor for quality control and metrology. And by combining specialized hardware with innovative software, Nikon’s XT H Series delivers the...

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X-ray sources IN-HOUSE DESIGN AND BUILD Detailed capture and measurement of internal component and assembly features is often vital for quality control, failure analysis and material research. The entry-level versatile XT H 225 system offers a microfocus X-ray source, an inspection volume to accomodate small to medium sized parts and high image resolution. Ready for ultrafast CT reconstruction, the XT H 225 covers a wide range of applications, including the inspection of plastic parts, small castings and complex mechanisms as well as researching materials and natural specimens. Nikon...

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The XT H 225 ST 2x system is ideally suited to a wide range of materials and sample sizes. The system can be configured with a range of industry-leading flat panel detectors, up to 2,880 x 2,880, 150 µm pixels, to best suit the user application. Dimensional inspection using industrial CT has many advantages, as all internal dimensions are measured without destroying the part. Metrology CT is possible by calibrating scans with reference measurements or using a metrology grade system. Tools for increasing scan speed, prolonging system uptime and maintaining measurement accuracy, when combined...

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Intelligent software Intuitive and user-friendly software is essential to simplify the process of CT scanning complex samples for accurate inspection. Developed inhouse, Inspect-X is designed to streamline the process of acquiring and reconstructing CT data, for both advanced and beginner users. The focus of Inspect-X is on intelligence, offering users only the information they need at any moment, therefore simplifying the task at hand. FLEXIBLE SOLUTIONS Inspect-X has multiple scanning techniques to meet the most demanding of applications from conventional circular CT scanning to X.Tend,...

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Advanced scanning technologies improve resolution, scan volume, and speed Enabling automated inspection, calibration, and evaluation LiB.Overhang Analysis Automatic high-speed analysis of anode overhang in Lithium-ion batteries. Cutting-edge Deep Learning AI precisely and reliably analyses the fastest CT scans, exporting repeatable results in a machine-readable format. LiB.Overhang Analysis enables closed-loop process control resulting in improved product quality and significantly reduced scrap. Tall objects can be scanned in a single acquisition process, eliminating artefacts introduced by...

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Sources Nikon Microfocus X-ray Sources Focal spot size range 20 µm at 20 W Pixel Size Manipulator # Axes Max. Circular CT Diameter Cabinet Length Note: All figures are intended for summary purposes and may vary based on exact system configuration. Contact your Nikon representative for detailed specifications of each configuration. NIKON CORPORATION ISO 14001 Certified for NIKON CORPORATION Shinagawa Intercity Tower C, 2-15-3, Konan, Minato-ku, Tokyo 108-6290 Japan Tel: +81 3 6433 3701 https://industry.nikon.com NIKON METROLOGY EUROPE NV Interleuvenlaan 86 B-3001 Leuven, Belgium Tel: +32 16...

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