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Catalog excerpts
![XT H Series - 1](https://img.directindustry.com/pdf/repository_di/21023/xt-h-series-1074448_1m.jpg)
ADVANCED INDUSTRIAL X-RAY AND CT
Open the catalog to page 1![XT H Series - 2](https://img.directindustry.com/pdf/repository_di/21023/xt-h-series-1074448_2m.jpg)
A wide range of applications X-ray computed tomography (CT) has been used for many years in laboratories to nondestructively inspect the interiors of samples such as fossils and ancient artifacts. There are compelling reasons for this academic and R&D interest: CT can detect voids, cracks, burrs, and other imperfections inside parts and assemblies without destruction. Now, this valuable technology is increasingly being introduced on the factory floor for quality control and metrology. And by combining specialized hardware with innovative software, Nikon’s XT H Series delivers the...
Open the catalog to page 2![XT H Series - 3](https://img.directindustry.com/pdf/repository_di/21023/xt-h-series-1074448_3m.jpg)
X-ray sources IN-HOUSE DESIGN AND BUILD Detailed capture and measurement of internal component and assembly features is often vital for quality control, failure analysis and material research. The entry-level versatile XT H 225 system offers a microfocus X-ray source, an inspection volume to accomodate small to medium sized parts and high image resolution. Ready for ultrafast CT reconstruction, the XT H 225 covers a wide range of applications, including the inspection of plastic parts, small castings and complex mechanisms as well as researching materials and natural specimens. Nikon...
Open the catalog to page 3![XT H Series - 4](https://img.directindustry.com/pdf/repository_di/21023/xt-h-series-1074448_4m.jpg)
The XT H 225 ST 2x system is ideally suited to a wide range of materials and sample sizes. The system can be configured with a range of industry-leading flat panel detectors, up to 2,880 x 2,880, 150 µm pixels, to best suit the user application. Dimensional inspection using industrial CT has many advantages, as all internal dimensions are measured without destroying the part. Metrology CT is possible by calibrating scans with reference measurements or using a metrology grade system. Tools for increasing scan speed, prolonging system uptime and maintaining measurement accuracy, when combined...
Open the catalog to page 4![XT H Series - 5](https://img.directindustry.com/pdf/repository_di/21023/xt-h-series-1074448_5m.jpg)
Intelligent software Intuitive and user-friendly software is essential to simplify the process of CT scanning complex samples for accurate inspection. Developed inhouse, Inspect-X is designed to streamline the process of acquiring and reconstructing CT data, for both advanced and beginner users. The focus of Inspect-X is on intelligence, offering users only the information they need at any moment, therefore simplifying the task at hand. FLEXIBLE SOLUTIONS Inspect-X has multiple scanning techniques to meet the most demanding of applications from conventional circular CT scanning to X.Tend,...
Open the catalog to page 5![XT H Series - 6](https://img.directindustry.com/pdf/repository_di/21023/xt-h-series-1074448_6m.jpg)
Advanced scanning technologies improve resolution, scan volume, and speed Enabling automated inspection, calibration, and evaluation LiB.Overhang Analysis Automatic high-speed analysis of anode overhang in Lithium-ion batteries. Cutting-edge Deep Learning AI precisely and reliably analyses the fastest CT scans, exporting repeatable results in a machine-readable format. LiB.Overhang Analysis enables closed-loop process control resulting in improved product quality and significantly reduced scrap. Tall objects can be scanned in a single acquisition process, eliminating artefacts introduced by...
Open the catalog to page 6![XT H Series - 7](https://img.directindustry.com/pdf/repository_di/21023/xt-h-series-1074448_7m.jpg)
Sources Nikon Microfocus X-ray Sources Focal spot size range 20 µm at 20 W Pixel Size Manipulator # Axes Max. Circular CT Diameter Cabinet Length Note: All figures are intended for summary purposes and may vary based on exact system configuration. Contact your Nikon representative for detailed specifications of each configuration. NIKON CORPORATION ISO 14001 Certified for NIKON CORPORATION Shinagawa Intercity Tower C, 2-15-3, Konan, Minato-ku, Tokyo 108-6290 Japan Tel: +81 3 6433 3701 https://industry.nikon.com NIKON METROLOGY EUROPE NV Interleuvenlaan 86 B-3001 Leuven, Belgium Tel: +32 16...
Open the catalog to page 7All Nikon Metrology catalogs and technical brochures
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XT V SERIES
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XT H 225 ST 2x
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VOXLS 30 SERIES
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APDIS Automotive
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MCT225 Metrology CT
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Industrial X-ray and CT
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NEXIV VMZ-S
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bw series
8 Pages
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automated ct
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Autocollimator
4 Pages
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X-ray CT inspection services
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Overview brochure
40 Pages
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NEXIV VMZ-K Series
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NEXIV VMZ-H3030
3 Pages
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NEXIV VMZ R-Series
7 Pages
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Microscope components
17 Pages
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Laser Radar Aerospace
6 Pages
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CMM-Manager for iNEXIV
4 Pages
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CAMIO8
16 Pages
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ALTERA CMM
8 Pages
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CMM-Manager
8 Pages
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Newsmagazine Vol.13
28 Pages
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MCAx-MM
8 Pages
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LC60Dx
4 Pages
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LC15Dx
8 Pages
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NWL200
5 Pages
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Eclipse MA200-MA100N
12 Pages
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Eclipse LV-N Microscopes
9 Pages
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XT V Series
12 Pages
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VMZ-R Series
7 Pages
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MM-Series
15 Pages
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Stereo microscopes
32 Pages
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AZ100M-AZ100
20 Pages
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NIS-Elements
20 Pages
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Laser Radar General
6 Pages
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XC65Dx(-LS)
2 Pages
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Digital sight series
9 Pages
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L100 Laser scanner
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Nikon Metrology Solutions
40 Pages
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Profile Projectors
12 Pages
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XT H Series
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Automated CT
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Configurable X-ray CT systems
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Focus
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iNEXIV VMA series
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K-Scan MMDx - K-CMM
4 Pages
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JEOL Smart Coater
2 Pages
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JCM 6000 Plus Neoscope
16 Pages
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iSpace Assembly Fabrication
4 Pages
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iSpace
6 Pages
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H14L
4 Pages
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eclipse E200pol
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Auto MeasureEyes
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gehl-kseries
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BW-Series
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X.Tract
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Nikon Metrology News Vol.10
28 Pages
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Nikon Metrology News Vol.9
28 Pages
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LV100N POL Ci POL
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LV-DAF Brochure
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Archived catalogs
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NEXIV VMR Brochure
5 Pages
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Intensilight Brochure
3 Pages
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Eclipse L200 Series
5 Pages
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Eclipse LV Series Brochure
10 Pages
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Eclipse LV100-UDM-POL
3 Pages
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Neoscope JCM-6000 Brochure
6 Pages
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K-Robot
2 Pages
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LC15 Optical Probe
2 Pages
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XC50-LS Cross Scanner
2 Pages
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stereomicroscope SMZ1000
7 Pages
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Neoscope Brochure
4 Pages
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Optistation-3100
2 Pages
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AMI-3000
2 Pages
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COOLSCOPE
8 Pages
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BioStation IM
5 Pages
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BioStation CT
8 Pages
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Neoscope Brochure
4 Pages
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DXM-1200C
6 Pages
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Optistation-3100
2 Pages
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AMI-3000
2 Pages
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Eclipse FN1
7 Pages
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Eclipse E100 Brochure
5 Pages
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Fluorescence Filter Blocks
6 Pages
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Eclipse 50i/55i Accessories
5 Pages
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Laser TIRF System
7 Pages
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Eclipse TS100/TS100F
8 Pages
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Eclipse Ti Brochure
15 Pages
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Eclipse TE2000 Brochure
28 Pages
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COOLSCOPE
8 Pages
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BioStation IM brochure
5 Pages
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BioStation CT brochure
8 Pages