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XT H 225 ST 2x

XT H 225 ST 2x
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Rethink shop floor processes with Quality 4.0 Productivity without compromise

AUTO.FILAMENT CONTROL Functionality for the shop floor Extended filament lifetime HALF.TURN CT Faster CT acquisition DETECTOR TECHNOLOGY Industry leading data quality For many years, X-ray CT (computed tomography) has been used in laboratories for inspecting the interior of samples such as fossils and artefacts. More recently, this valuable technology has been finding its way into the manufacturing environment for quality control applications. It is able to non-destructively detect voids, burrs, cracks and other imperfections inside components and assemblies, including those that have been...

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2x productivity without compromise The integration of industry-leading features into the XT H 225 ST 2x microfocus X-ray CT system allows a doubling of data acquisition speed and hence of inspection productivity. It is a result of using advanced detector technology combined with new functionality including Half.Turn CT and Rotating.Target 2.0. HALF.TURN CT, FASTER CT ACQUISITION Instead of rotating the sample under investigation through 360 degrees while the X-rays directed at it are either absorbed or pass through to the detector, Nikon Metrology has devised a method that allows sufficient...

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Maximum availability for high inspection productivity Results that you can trust Nikon Metrology understands that there are two essential facets to achieving high inspection productivity: first, high speed data acquisition and reconstruction; and secondly, maximum uptime of the X-ray system. Equipment availability is a function not only of overall reliability but also of long intervals between, and short downtimes for, maintenance jobs such as periodic replacement of the filament. AUTOMATED DETECTOR EVALUATION Flat panel detectors at Nikon Metrology are qualified to ASTM E2597 and users are...

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Quality 4.0 The goal of Industry 4.0 is to enable manufacturers to produce better products at a lower cost, speed up the response to changes in demand, and shorten time to market, everything together resulting in greater competitiveness. In this context, quality control can no longer be a pure qualifier of good or bad products. Going forward, inspection needs to provide the information to proactively control the manufacturing process, resulting in zero defect production. This paradigm shift in quality control is referred to as Quality 4.0. It requires more frequent and more detailed...

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Flexibility when you need it The XT H 225 ST 2x can be configured with industry-leading flat panel detectors up to 2,880 x 2,880 pixels (150 µm). Together with the ability to exchange the X-ray targets, motorised moveable FID and choice of measurement modes, the system is a very flexible tool that can cope with a wide range of samples and inspection challenges. This means that the XT H 225 ST 2x is not only suited for fast series inspection, but also fits well with the needs of R&D work, pre-series support, quality control and failure analysis. FOUR TARGET OPTIONS, ONE SOURCE With a choice...

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X-ray Source Type Target Options Open Tube Microfocus Maximum Active Area Reflection Target Rotating Target 2.0 Transmission Target Multimetal Target Maximum Pixel Matrix Maximum Energy Maximum Power Minimum Focal Spot Minimum Pixel Size Maximum Frame Rate Type Maximum CT Swept Diameter Motorised moveable Maximum Sample Weight Not all specifications are available simultaneously, contact us to configure a system to meet your requirements. With more than 3,000 systems installed globally, Nikon Metrology has designed and manufactured X-ray CT equipment in-house for over 30 years. We are...

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