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Overview brochure

Overview brochure
40Pages

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X-RAY AND CT INSPECTION CMM LASER SCANNING HANDHELD LASER SCANNING COORDINATE MEASURING MACHINES METROLOGY SOFTWARE LARGE SCALE METROLOGY ROBOT METROLOGY VIDEO MEASURING INSTRUMENTS MEASURING MICROSCOPES INDUSTRIAL MICROSCOPES METROLOGY SERVICES NIKON METROLOGY I VISION BEYOND PRECISION

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4 X-RAY AND CT INSPECTION X-ray sources XT H series industrial Computed Tomography systems Configurable X-ray CT systems MCT series Metrology CT XT V series electronics X-ray inspection CT Automation 13 MULTI-SENSOR METROLOGY CMM-based scanners Coordinate Measuring Machines HN-C3030 gear inspection ModelMaker handheld scanners MCAx - Manual CMM Arm K-Scan MMDx walk-around scanner FOCUS Point cloud software CMM-Manager metrology software 3rd party software integrations 24 METROLOGY assisted production / ROBOT METROLOGY 28 MEASURING INSTRUMENTS iNEXIV VMA high-speed digital benchtop imaging...

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Get the inside picture of complex electronics or industrial parts, by literally looking into the internal structure. Then use CT capability to qualify and quantify any inner or outer dimension, all in a smooth, non-destructive process. X-RAY SOURCES XT H 225 / 225 ST INDUSTRIAL CT XT H 320 INDUSTRIAL CT XT H 450 HIGH VOLTAGE CT LARGE ENVELOPE CT SYSTEMS MCT225 METROLOGY CT XT V 130C / XT V 160 ELECTRONICS X-RAY INSPECTION CT AUTOMATION 3

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X-RAY SOURCES In-house design and build Nikon Metrology X-ray sources are at the heart of our technology and have been designed and manufactured in-house from 1987 to this day; offering over 30 years of knowledge. Being at the heart of the image, control over the X-ray source technology allows Nikon Metrology to quickly move with the market and develop complete and innovative solutions to the application demand. All sources are open-tube giving a low cost of ownership and range from low (180) to medium (225) to high (450) kV, all with micron resolution. 180 kV transmission target Applicable...

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ENTER THE WORLD OF X-RAY CT Detailed capture and measurement of internal component and assembly features is often vital for quality control, failure analysis and material research. The entry-level XT H 225 systems feature a microfocus X-ray source offering high image resolution. The XT H 225 ST system is an extended version capable of housing larger or heavier samples and a choice of X-ray sources ranging from transmission target 180 kV to rotating target high flux 225 kV. They cover a wide range of applications, including the inspection of plastic parts, small castings and complex...

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LARGE CABINET MICROFOCUS CT The XT H 320 is a large cabinet system for the X-ray CT scanning and metrology of large components. The system consists of a 320 kV microfocus source delivering up to 320 W of power. A high resolution flat panel is used to collect high quality images of the sample. The system is controlled by Inspect-X software which makes the collection of CT data and setting up of measurements simple and easy. The system can output volume data to industry standard volume viewing software Stunning images Multi-material or lower attenuating samples are better scanned with Perkin...

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HIGH VOLTAGE 450 kV MICROFOCUS CT The XT H 450 sets a new reference for turbine blade measurement and NDT inspection of small to medium castings. At the core of this powerful equipment is a 450 kV microfocus source, providing superior resolution and accuracy. The curved linear array detector optimizes the collection of X-rays by eliminating scatter phenomena that typically corrupt 2D radiographs of blades and other metal parts. Applications • Detailed analysis of the wall thickness and internal structure of turbine blades • Automated pass/fail inspection of blades • Inspection of high...

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LIMITLESS CONFIGURATIONS FOR PRECISION CT SCANNING Nikon Metrology’s configurable X-ray/CT systems offer a large inspection envelope, support multiple sources, multiple detectors and can be custom-configured to fit a variety of applications. Nikon Metrology’s modular microfocus CT systems can be built into existing cabinets or walk-in rooms to upgrade older film-based facilities or mini-focus systems. The core of these configurable systems are the Nikon in-house-built micro focus sources up to 450 kV. The focal spot size of these microfocus sources is orders-of-magnitude smaller when...

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ABSOLUTE ACCURACY FOR INSIDE METROLOGY MCT225 efficiently measures internal and external geometry without reference measurements and damaging the sample. With fifty years’ CMM experience and twenty five years’ X-ray experience, our pedigree for reliable high quality Metrology CT is second to none. Absolute accuracy MCT225 is pre-calibrated using accuracy standards traceable to the UK’s national measurement institute (NPL) and verified using VDI/VDE 2630 guidelines for Computed Tomography in Dimensional Measurement. Absolute Accuracy guarantees measurement accuracy without time consuming...

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TOP-CLASS X-RAY INSPECTION SYSTEM Component connections on today’s compact and densely populated PCBs are hidden by other components, making X-ray the only viable inspection solution. XT V 160 is an easy-to-use, cost-effective and high-quality PCB inspection system targeting production facilities and failure analysis laboratories. In automated inspection mode, samples can be inspected at the highest throughput. In manual mode, intuitive software and high-precision sample manipulation enable operators to visualize and evaluate the tiniest internal defects and deficiencies. Features •...

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VERSATILE AND EASY-TO-USE ELECTRONICS QA SYSTEM The XT V 130C is a highly flexible and costeffective electronics and semiconductor inspection system. The system features a 130 kV/10 watt Nikon Metrology manufactured source, a globally recognized open tube design with integrated generator, and a high-resolution imaging chain. Through a series of factory and field upgrades, the end-user can configure these systems to its own needs with a higher power source, a rotating sample tray, automatic inspection software, a digital flat panel option, and the ability to add future-proof CT technology....

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