Group: NIKON GROUP
Catalog excerpts
Imaging Software NIS-Elements Nikon Imaging Software Advanced Solutions for vour Imaging World vj k r* \ \ O o pv % rt r i ^v % t o t rv i % \ \ % ci ^ \ \ \ m K k \ %
Open the catalog to page 1Nikon offers a total software solution for image capturing, archiving, and analysis Why NIS-Elements? NIS-Elements is an integrated software imaging platform which delivers comprehensive control of microscopes and peripheral devices, image capturing, documentation, image analysis and data management of up to six dimensions. This system contributes to experiment efficiency with intuitive image analysis features and database building capabilities developed to handle archiving and management of large numbers of multidimensional image files. Unified control of the entire imaging system offers...
Open the catalog to page 2O : Full function A : Limited function —: Not available • / ▲
Open the catalog to page 3Image AcquisitionNIS-Elements offers the most suitable image acquisition for various applications with the integrated control of the camera, motorized microscope and peripheral devices. Multichannel (multi color) BI1D NIS-Elements can acquire full bit depth multi-color images, combining multiple fluorescence wavelengths and different illumination methods (DIC, phase contrast etc.), while offering independently scalable channels. Through motorized focus control, NIS-Elements reconstructs and renders 3D images from multiple Z-axis planes. Optical Conf.__[Name___I Como. Color iTPos. Time Lapse...
Open the catalog to page 4Image Stitching (Large image) Large Image Acquisition generates a single high-magnification wide field-of-view image by automatically stitching multiple adjacent frames from a multipoint acquisition using a motorized stage or from multiple single images captured from a previous session. Users can easily select image acquisition ranges and areas from low magnification images. Option Option Option Option Option Option Multidimensional imaging * Available dimensions vary depending on the package. NIS-Elements captures images in a combination of multiple dimensions such as Time-Lapse,...
Open the catalog to page 5Optical Configuration Presets or ‘Optical Configurations’ can be saved for each observation method such as FITC fluorescence and DIC imaging, memorizing the settings of the microscope, camera and peripheral devices. The optical configurations are created through a one click set up and are displayed as icons in the tool bar for easy access and use. Option Memorize settingsOption and microscope of the camera Camera setting Option Option Microscope Setting Movie Capture, Fast Image Capture NIS-Elements has several options to observe and capture a sample’s change and fast movement. Fast Time...
Open the catalog to page 6High Speed Device Operation by Triggering * ome cameras and devices are not compatible with these functions. For more information, S please contact Nikon or an authorized representative. Triggered Acquisition Triggering external devices directly from the camera enables synchronized control of various devices such as the laser unit without passing through the PC. This allows for the fastest performance of the system components for multi-wavelength excitation in TIRF observation. Camera Light Source Option Option Option Option Option Ti-recipe This function enables the HUB-A controller of the...
Open the catalog to page 7Display and Data Processing Various methods are available for displaying and processing captured images and datasets. Multi-dimensional Image Display NIS-Elements displays time lapse, multi-channel, multiple X, Y, Z positions in an intuitive layout, which allows for automatic playback and the ability to select subsections of the data to be saved as a new file. Option Option Option Option Option Time Multipoint Z-series Channel Merge Channels Multiple single channel images (ex., two from three-channel acquisition images) can be merged together to create an overlay of full depth separately...
Open the catalog to page 8Z-Series Image Display (Volume View) * Volume view and slice view are only possible with AR and BR. Z-series images can be displayed in various formats such as max. and min. projections, X-Z axis and Y-Z axis cross–sectional slice view and 3D volume view. Rotatable 3D volume rendered views from 3D datasets are easily converted to an AVI or MOV format for file sharing and export. Projection Volume View Slices View Option Option Option Option Option Option A combination of an AR package and a graphic board that supports DirectX 10 or later enables higher and more complex image display than...
Open the catalog to page 9Measurement and Analysis Manual Measurement (Interactive Measurement) and Image Annotation Interactive Measurement allows easy measurement of length and area by drawing lines or an object directly on the image. The results can be attached to the image, and also exported as text or to an Excel spreadsheet. Annotations such as arrows, circles, squares, text are also available display options. Option Option Option Option Histogram/Intensity Line Profile/Intensity Surface Plot Histogram measurement measures the intensity distribution of pixels across the whole image or a defined region. An...
Open the catalog to page 10Option Option Option Option Time (Intensity) Measurement Time measurement creates a graph of sequential intensity changes while time-lapse imaging or from captured time-lapse images. Ratio view function* allows the Option measurement of the ratio of two wavelengths across multiple ROIs and shows the ratio value by pixel. Numeric data and graph images are exportable and the measurements on the graph are available as well. (* Only with AR) ❶ Intensity Graph Ratio: Green/Red Option Option Calcium & FRET Ca ion concentration calibration of the ratiometric fluorochrome Fura2, for example, is...
Open the catalog to page 11Option Option General Analysis streamlines the setup of image analysis combining functions, such as image preprocessing and thresholding, processing of binary images and features, Option and measurement settings. • GA creates a new measurement area by combining multiple binary layers, and creates a new measurement parameter by applying these custom measurement settings. Option • Each setting can be stored as a recipe that can be rerun for routine analysis under the same conditions across multiple datasets. Setup of multiple analysis tasks Combine binary layers Create new measurement lists...
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