Group: NIKON GROUP
Catalog excerpts
Automatic Macro Inspection System I Featuring High Throughput and Exceptional Sensitivity The AMI-3000 automatic macro inspection system brings together all of Nikon's expertise in semiconductor manufacturing to enhance macro inspection precision, providing quantified reference criteria and enabling more efficient process management. The AMI-3000 offers a substantial increase in yield.
Open the catalog to page 1Automatic Macro Inspection System High Detection Sensitivity Nikon's exclusive diffracted light detection system detects pattern variation, due to defocus by the stepper or uneven coating by the coater, with excellent sensitivity. Our proprietary algorithms accurately recognize diffracted light from the top pattern layer, making it possible to identify defects in underlying patterns. Inspection of Entire Surface of Every Wafer Offers Higher Throughput Capturing the entire wafer surface in a single image provides one of the world's highest throughputs for an automatic macro inspection system...
Open the catalog to page 2All Nikon Metrology catalogs and technical brochures
-
APDIS Automotive
7 Pages
-
MCT225 Metrology CT
4 Pages
-
Industrial X-ray and CT
7 Pages
-
NEXIV VMZ-S
5 Pages
-
bw series
8 Pages
-
automated ct
8 Pages
-
Autocollimator
4 Pages
-
X-ray CT inspection services
1 Pages
-
Overview brochure
40 Pages
-
NEXIV VMZ-K Series
5 Pages
-
NEXIV VMZ-H3030
3 Pages
-
NEXIV VMZ R-Series
7 Pages
-
Microscope components
17 Pages
-
Laser Radar Aerospace
6 Pages
-
CMM-Manager for iNEXIV
4 Pages
-
CAMIO8
16 Pages
-
ALTERA CMM
8 Pages
-
CMM-Manager
8 Pages
-
Newsmagazine Vol.13
28 Pages
-
MCAx-MM
8 Pages
-
LC60Dx
4 Pages
-
LC15Dx
8 Pages
-
NWL200
5 Pages
-
Eclipse MA200-MA100N
12 Pages
-
Eclipse LV-N Microscopes
9 Pages
-
XT V Series
12 Pages
-
VMZ-R Series
7 Pages
-
MM-Series
15 Pages
-
Stereo microscopes
32 Pages
-
AZ100M-AZ100
20 Pages
-
NIS-Elements
20 Pages
-
Laser Radar General
6 Pages
-
XC65Dx(-LS)
2 Pages
-
Digital sight series
9 Pages
-
L100 Laser scanner
8 Pages
-
Nikon Metrology Solutions
40 Pages
-
Profile Projectors
12 Pages
-
XT H Series
12 Pages
-
Automated CT
8 Pages
-
Configurable X-ray CT systems
12 Pages
-
Focus
6 Pages
-
iNEXIV VMA series
5 Pages
-
K-Scan MMDx - K-CMM
4 Pages
-
JEOL Smart Coater
2 Pages
-
JCM 6000 Plus Neoscope
16 Pages
-
iSpace Assembly Fabrication
4 Pages
-
iSpace
6 Pages
-
H14L
4 Pages
-
eclipse E200pol
3 Pages
-
Auto MeasureEyes
2 Pages
-
gehl-kseries
2 Pages
-
BW-Series
8 Pages
-
X.Tract
2 Pages
-
Nikon Metrology News Vol.10
28 Pages
-
Nikon Metrology News Vol.9
28 Pages
-
LV100N POL Ci POL
5 Pages
-
LV-DAF Brochure
2 Pages
Archived catalogs
-
NEXIV VMR Brochure
5 Pages
-
Intensilight Brochure
3 Pages
-
Eclipse L200 Series
5 Pages
-
Eclipse LV Series Brochure
10 Pages
-
Eclipse LV100-UDM-POL
3 Pages
-
Neoscope JCM-6000 Brochure
6 Pages
-
K-Robot
2 Pages
-
LC15 Optical Probe
2 Pages
-
XC50-LS Cross Scanner
2 Pages
-
stereomicroscope SMZ1000
7 Pages
-
Neoscope Brochure
4 Pages
-
Optistation-3100
2 Pages
-
COOLSCOPE
8 Pages
-
BioStation IM
5 Pages
-
BioStation CT
8 Pages
-
Neoscope Brochure
4 Pages
-
DXM-1200C
6 Pages
-
Optistation-3100
2 Pages
-
AMI-3000
2 Pages
-
Eclipse FN1
7 Pages
-
Eclipse E100 Brochure
5 Pages
-
Fluorescence Filter Blocks
6 Pages
-
Eclipse 50i/55i Accessories
5 Pages
-
Laser TIRF System
7 Pages
-
Eclipse TS100/TS100F
8 Pages
-
Eclipse Ti Brochure
15 Pages
-
Eclipse TE2000 Brochure
28 Pages
-
COOLSCOPE
8 Pages
-
BioStation IM brochure
5 Pages
-
BioStation CT brochure
8 Pages