N23010 series Data Sheet semiconductor voltage tester
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N23010 series Data Sheet semiconductor voltage tester - 1

ELECTRONIC SOLUTION PROVIDER FOR INTELLIGENT MANUFACTURING N23010 Series High Precision Multi Channel Programmable DC Power Supply Product Introduction N23010 series is a high-precision, multi-channel programmable DC power supply specially developed for the semiconductor industry, which can provide high-precision, stable and pure power for chips, and cooperate with the environmental test chamber for a number of environmental reliability tests. Its voltage accuracy up to 0.01%, support μA level current measurement, up to 24 channels for single unit, support local/remote (LAN/RS232/CAN) control, to meet the needs of chip batch, automatic testing. Application Fields Chip test board High Precision Multi Channel DC Power Supply � Environmental Test Chamber To complete HTOL, LTOL, ELFR/EFR, HAST, THB, etc., and support chip leakage current measurement test within Environmental Test Chamber Main Features Accuracy and stability Ensure test reliability: Reliability test usually requires multiple chips to run for a long time under power supply. Take HTOL as an example, the number of samples are at least 231 pieces and the test time is up to 1000 hours. N23010 voltage precision is 0.6mV, long-term stability 80ppm/1000h, voltage ripple noise ≤2mVrms, can effectively ensure the reliability of the user test process all round protection, ensure the safety of instruments and products under test. Ultra-high integration, saving user investment: In the process of chip R&D, flow sheet and mass production, Usually it is necessary to carry out reliability test on multiple groups of samples. In addition, the leakage current of chip or jointed board is also an important test index. The traditional scheme usually adopts multiple linear power sources with data sampling, which is troublesome to connect and occupies test space. The N23010 integrates up to 24 power channels in a 19-inch 3U chassis to support μA-level current measurement, providing a highly integrated solution for large-scale chip testin

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N23010 series Data Sheet semiconductor voltage tester - 2

ELECTRONIC SOLUTION PROVIDER FOR INTELLIGENT MANUFACTURING Fast dynamic response: N23010 is provided fast dynamic response capability, under the full voltage output, the load changes from 10% to 90%, voltage recovery to the original voltage reduction within 50mV time is less then 200μs, to ensure that the voltage or current rise waveform within high speed and no over impulse, to provide stable power supply for the chip under test. Sequence editing: N23010 supports sequence editing function. Users can set output voltage, output current and single step running time. 100 groups of voltage and...

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N23010 series Data Sheet semiconductor voltage tester - 3

DC Power Supply ELECTRONIC SOLUTION PROVIDER FOR INTELLIGENT MANUFACTURING Technical Data Sheet Note [1] : Under the full voltage output, the load changes from 10% to 90%, the value which voltage drop Note [2] : Under the full voltage output, the load changes from 10% to 90%, and the voltage recovers to the original voltage reduction within 50mV Remark : For other specifications, please contact NGI. Note 2: All specifications are subject to change without notice

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