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N23010 series Data Sheet semiconductor voltage tester

N23010 series Data Sheet semiconductor voltage tester

N23010 series Data Sheet semiconductor voltage tester

Product catalog summary
Product Introduction
The N23010 Series is a high-precision, multi-channel programmable DC power supply designed for the semiconductor industry. It ensures test reliability with a voltage precision of 0.6mV, long-term stability of 80ppm/1000h, and voltage ripple noise ≤2mVrms. It supports up to 24 channels per unit and offers local/remote control options via LAN, RS232, and CAN interfaces.

Application Fields
This power supply is suitable for various reliability tests such as HTOL, LTOL, ELFR/EFR, HAST, and THB, and supports chip leakage current measurement within an environmental test chamber.

Main Features
  • Ultra-high Integration: Integrates up to 24 power channels in a 19-inch 3U chassis, supporting μA-level current measurement, which is ideal for large-scale chip testing.
  • Fast Dynamic Response: Offers fast dynamic response capability, with voltage recovery within 200μs after load changes from 10% to 90%.
  • Sequence Editing: Supports sequence editing for output voltage, current, and running time, allowing customization of up to 100 groups of sequences.
  • Communication Interfaces: Equipped with RS232, LAN, and CAN ports for building automatic test systems.

Product Dimensions
The device measures 132.5mm in height, 482mm in width, and 559mm in depth, with a net weight of approximately 17kg.

Technical Data Sheet
  • Voltage Range: 0~6V or 0~15V depending on the model, with a setting and readback resolution of 0.1mV.
  • Current Range: 0~1A, 0~3A, or 0~5A, with a setting and readback resolution of 0.1mA.
  • Dynamic Performance: Voltage rise time and drop time are specified, with transient recovery time under 100μs.
  • Operating Environment: Suitable for temperatures between 0℃ and 40℃, with storage temperatures from -20℃ to 60℃.
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Catalog excerpts

N23010 series Data Sheet semiconductor voltage tester-1

ELECTRONIC SOLUTION PROVIDER FOR INTELLIGENT MANUFACTURING N23010 Series High Precision Multi Channel Programmable DC Power Supply Product Introduction N23010 series is a high-precision, multi-channel programmable DC power supply specially developed for the semiconductor industry, which can provide high-precision, stable and pure power for chips, and cooperate with the environmental test chamber for a number of environmental reliability tests. Its voltage accuracy up to 0.01%, support μA level current measurement, up to 24 channels for single unit, support local/remote (LAN/RS232/CAN) control, to meet the needs of chip batch, automatic testing. Application Fields Chip test board High Precision Multi Channel DC Power Supply � Environmental Test Chamber To complete HTOL, LTOL, ELFR/EFR, HAST, THB, etc., and support chip leakage current measurement test within Environmental Test Chamber Main Features Accuracy and stability Ensure test reliability: Reliability test usually requires multiple chips to run for a long time under power supply. Take HTOL as an example, the number of samples are at least 231 pieces and the test time is up to 1000 hours. N23010 voltage precision is 0.6mV, long-term stability 80ppm/1000h, voltage ripple noise ≤2mVrms, can effectively ensure the reliability of the user test process all round protection, ensure the safety of instruments and products under test. Ultra-high integration, saving user investment: In the process of chip R&D, flow sheet and mass production, Usually it is necessary to carry out reliability test on multiple groups of samples. In addition, the leakage current of chip or jointed board is also an important test index. The traditional scheme usually adopts multiple linear power sources with data sampling, which is troublesome to connect and occupies test space. The N23010 integrates up to 24 power channels in a 19-inch 3U chassis to support μA-level current measurement, providing a highly integrated solution for large-scale chip testin

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N23010 series Data Sheet semiconductor voltage tester-2

ELECTRONIC SOLUTION PROVIDER FOR INTELLIGENT MANUFACTURING Fast dynamic response: N23010 is provided fast dynamic response capability, under the full voltage output, the load changes from 10% to 90%, voltage recovery to the original voltage reduction within 50mV time is less then 200μs, to ensure that the voltage or current rise waveform within high speed and no over impulse, to provide stable power supply for the chip under test. Sequence editing: N23010 supports sequence editing function. Users can set output voltage, output current and single step running time. 100 groups of voltage and current...

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N23010 series Data Sheet semiconductor voltage tester-3

DC Power Supply ELECTRONIC SOLUTION PROVIDER FOR INTELLIGENT MANUFACTURING Technical Data Sheet Note [1] : Under the full voltage output, the load changes from 10% to 90%, the value which voltage drop Note [2] : Under the full voltage output, the load changes from 10% to 90%, and the voltage recovers to the original voltage reduction within 50mV Remark : For other specifications, please contact NGI. Note 2: All specifications are subject to change without notice

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