NI PCIe-6321
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Catalog excerpts

NI PCIe-6321 - 1

Technical Sales (866) 531-6285 orders@ni.com Requirements and Compatibility | Ordering Information | Detailed Specifications | Pinouts/Front Panel Connections For user manuals and dimensional drawings, visit the product page resources tab on ni.com. NI X Series Multifunction Data Acquisition Overview NI X Series devices for USB, PCI Express and PXI Express are the most advanced data acquisition devices ever designed by National Instruments. They feature significant improvements in onboard timing and triggering and optimizations for use with multicore PCs. X Series devices integrate high-performance analog, digital, and counter/timer functionality onto a single device, making them well-suited for a broad range of applications, from basic data logging to control and test automation. Back to Top Requirements and Compatibility OS Information Driver Information Software Compatibility ANSI C/C++ LabVIEW Real-Time Module Measurement Studio SignalExpress Visual Basic Visual Studio .NET Comparison Tables Model Number Max AO Digital Update Rate I/O Lines Max Digital Triggering I/O Rate Analog, Digital Analog, Digital

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NI PCIe-6321 - 2

Model Number Max AO Digital Update Rate I/O Lines Max Digital Triggering I/O Rate Analog, Digital Analog, Digital Analog, Digital Analog, Digital Analog, Digital Analog, Digital Application and Technology NI-STC3 Timing and Synchronization Technology NI X Series multifunction data acquisition (DAQ) devices include the NI-STC3, an ASIC designed by NI for advanced timing, triggering, and synchronization. This technology includes the following: Four counter/timers with more functionality than ever before, such as the ability to create a finite pulse train with a single counter A 100 MHz...

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Whether you are validating a new hardware design, monitoring conditions on a factory floor, or recording temperature changes during a scientific experiment, you need to take measurements, visualize your data, and often log it to disk. With X Series multifunction DAQ, you can develop a user-defined measurement system by using intuitive graphical programming software and incorporating the exact visualization, analysis, and data-logging capabilities your application requires. Control Systems If you need to control the temperature of a room, the speed of a motor, or the pressure of hydraulic...

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LabVIEW Professional Development System for Windows Advanced software tools for large project development Quickly configure projects without programming Control over 400 PC-based and stand-alone instruments Tight integration with a wide range of hardware Log data from more than 250 data acquisition devices Advanced measurement analysis and digital signal processing Perform basic signal processing, analysis, and file I/O Open connectivity with DLLs, ActiveX, and .NET objects Scale your application with automatic LabVIEW code generation Capability to build DLLs, executables, and MSI...

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Visit ni.com/training for more information. Extended Warranty NI offers options for extending the standard product warranty to meet the life-cycle requirements of your project. In addition, because NI understands that your requirements may change, the extended warranty is flexible in length and easily renewed. For more information, visit ni.com/warranty. OEM NI offers design-in consulting and product integration assistance if you need NI products for OEM applications. For information about special pricing and services for OEM customers, visit ni.com/oem. Alliance Our Professional Services...

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Input FIFO size Scan list memory Data transfers Overvoltage protection (AI <0..31>, AI SENSE, AI SENSE 2) Input current during overvoltage condition Settling Time for Multichannel Measurements Accuracy, full scale step, all ranges Analog triggers Typical Performance Graphs Analog Output Number of channels NI 6320 Monotonicity Maximum update rate Timing accuracy Timing resolution Output range Output coupling Output impedance Output current drive

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Overdrive protection Overdrive current Power-on state Power-on/off glitch 8,191 samples shared among channels used Output FIFO size Data transfers AO waveform modes: Non-periodic waveform Periodic waveform regeneration mode from onboard FIFO Periodic waveform regeneration from host buffer including dynamic update Settling time, full scale step 15 ppm (1 LSB) Slew rate Glitch energy Magnitude Calibration (AI and AO) Recommended warm-up time Calibration interval AI Absolute Accuracy Table Nominal Range Residual Gain Error (ppm of Reading) Gain Tempco (ppm/°C) Reference Tempco (ppm/°C)...

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Nominal Range Positive Full Scale Negative Full Scale Residual Gain Error (ppm of Reading) Gain Tempco (ppm/°C) Reference Tempco (ppm/°C) Residual Offset Error (ppm of Range) Offset Tempco (ppm of Range/°C) Absolute Accuracy at Full Scale1 (μV) Absolute Accuracy Formulas 1 Absolute Accuracy at full scale numbers is valid immediately following internal calibration and assumes the device is operating within 10 °C of the last external calibration. AbsoluteAccuracy = OutputValue · (GainError) + Range · (OffsetError) GainError = ResidualGainError + GainTempco · (TempChangeFromLastInternalCal) +...

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Edge counting, pulse, pulse width, semi-period, period, two-edge separation X1, X2, X4 quadrature encoding with Channel Z reloading; two-pulse Pulse, pulse train with dynamic updates, frequency division, equivalent time

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External base clock frequency Base clock accuracy Gate, Source, HW_Arm, Aux, A, B, Z, Up_Down, Sample Clock Any PFI, RTSI, many internal signals Routing options for inputs Dedicated scatter-gather DMA controller for each counter/timer, programmed I/O Data transfers Frequency Generator Number of channels Base clocks Base clock accuracy Output can be available on any PFI or RTSI terminal. Reference clock locking frequencies Reference Signal Locking Input Frequency (MHz) RTSI <0..7> 10, 20 100 MHz Timebase; other signals derived from 100 MHz Timebase including 20 MHz and 100 kHz Timebases...

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