Nanosurf NaioAFM

Product catalog summary

Overview: The NaioAFM is an all-in-one atomic force microscope designed for nanoeducation and small sample measurements. It offers ease of use, solid performance, and affordability, making it suitable for educational settings and compact spaces.

Key Features:

Integrated components including a controller, XY-table, airflow shielding, and vibration isolation.
High-resolution top view camera and side view sample observation.
Comprehensive operating modes and simple cantilever exchange without the need for laser or detector adjustments.
No setup required; simply connect to a PC and start the software.

Specifications:

Maximum scan range/height: 70 µm/14 µm with high resolution.
Static/Dynamic RMS Z-noise: Typically 0.4 nm/0.3 nm.
Maximum sample size/height: 12 mm/3.5 mm.
Top view camera: 5.0 MPixel color CMOS with 4× digital zoom.
Imaging modes include static force, dynamic force, phase contrast, MFM, and EFM.
Advanced modes and spectroscopy options available with additional packages.

Applications: The NaioAFM is suitable for educational purposes, allowing users to acquire meaningful AFM images and data quickly, which is beneficial in time-constrained courses.

Additional Information: The system is compatible with various software interfaces and requires a Windows operating system. It is compact and lightweight, making it easy to transport and set up.

Contact Information: Nanosurf has offices in Switzerland, Germany, the UK, the USA, China, India, and Singapore. For more information, visit their website or contact them via email.

Catalog excerpts

Next-Level Nanotechnology Tools + swiss quality

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All-in-one atomic force microscope The NaioAFM is the ideal atomic force microscope for nanoeducation and small sample measurements. This all-in-one AFM system provides solid performance and easy handling, with a price tag and footprint that fit anyone and any place. Integrated controller, XY-table, airflow shielding, and vibration isolation High resolution top view camera and side view sample observation built in Feature-complete: all standard operating modes available Simple cantilever exchange: no laser or detector adjustment required No system setup needed: just plug into your PC and start...

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Particle size Left: Staphylococcus aureus bacterial sample. Scan size 5.0 pm. Right: Gold colloids. Scan size 1.5 pm. Left: data storage Digital backup tape with magnetically stored data, as revealed by MFM. Scan size 50 pm. Right: atomic steps HOPG. Single layer height is 0.34 nm. Image Z-range is 3.5 nm. Scan size 3.2 pm. NaioAFM side view camera, Naio advanced modes option, Isostage adapters for Naio, AFM extended sample kit Max. scan range / scan height (resolution)™ 70 pm (1.0 nm) / 14 pm (0.2 nm) Static / Dynamic RMS Z-noise typ. 0.4 nm (max. 0.8 nm) / typ. 0.3 nm (max....

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Nanosurf AG Liestal, Switzerland +41 61 927 47 47 Nanosurf GmbH Langen, Germany +49 6103 202 7163 Nanosurf UK Bracknell, UK +44 1344 388 008 Nanosurf Inc. Woburn, MA, USA +1 781 549 7361 Santa Barbara, CA, USA +1 805 696 3938 Nanosurf 中国 Nanosurf China, Shanghai [email protected] www.nanosurf.com Nanosurf and the Nanosurf Logo are trademarks of Nanosurf AG Copyright © 2019 Nanosurf

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Nanosurf NaioAFM

Nanosurf NaioAFM

Catalog excerpts

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