Next-Level Nanotechnology Tools + swiss quality

All-in-one atomic force microscope The NaioAFM is the ideal atomic force microscope for nanoeducation and small sample measurements. This all-in-one AFM system provides solid performance and easy handling, with a price tag and footprint that fit anyone and any place. Integrated controller, XY-table, airflow shielding, and vibration isolation High resolution top view camera and side view sample observation built in Feature-complete: all standard operating modes available Simple cantilever exchange: no laser or detector adjustment required No system setup needed: just plug into your PC and start...

Particle size Left: Staphylococcus aureus bacterial sample. Scan size 5.0 pm. Right: Gold colloids. Scan size 1.5 pm. Left: data storage Digital backup tape with magnetically stored data, as revealed by MFM. Scan size 50 pm. Right: atomic steps HOPG. Single layer height is 0.34 nm. Image Z-range is 3.5 nm. Scan size 3.2 pm. NaioAFM side view camera, Naio advanced modes option, Isostage adapters for Naio, AFM extended sample kit Max. scan range / scan height (resolution)™ 70 pm (1.0 nm) / 14 pm (0.2 nm) Static / Dynamic RMS Z-noise typ. 0.4 nm (max. 0.8 nm) / typ. 0.3 nm (max....

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