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Nanosurf LensAFM - 2 Pages

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Nanosurf LensAFM

Catalog excerpts

LensAFM AFM for upright microscopes and 3D profilometers Nanometer resolution 3-D surface structure data Next-Level Nanotechnology Tools Material property information / swiss quality

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LensAFM LensAFM — AFM for upright microscopes and 3D profilometers The Nanosurf LensAFM is an atomic force microscope that can be used instead of a normal objective lens on almost any optical microscope or profilometer. It greatly extends the resolution and measuring capabilities of these instruments. The LensAFM not only provides 3D surface topography information, but can be used to analyze various physical properties of a measurement sample as well. Key Features •• Mountable on virtually any optical microscope or 3D optical profilometer •• quipped with an objective lens for a clear view...

 Open the catalog to page 2

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