The FlexAFM has been the instrument of choice for hundreds of researchers in need of a reliable and versatile atomic force microscope system. Built with ease of use and configurability in mind, the capabilities of the FlexAFM cover most research needs: Configure your FlexAFM for 2D materials research in a glovebox, or integrate it with your inverted optical microscope for biological applications - no matter what your research goals are, the Nanosurf FlexAFM provides you with an affordable mid-range instrument that you can expand and upgrade as your requirements evolve. • Reliable and robust:...

Graphene Cutting Topography of SrTiO3 in dynamic mode. Scan size: 1 x 1 µm². Quality control of CVD-grown graphene flakes on post-oxidized copper measured by friction (data courtesy: Newtec engineering A/S). Scan size: 10 x 10 µm² Cutting graphene by AFM lithography. Sample courtesy: Kim group, Harvard University, USA. MFM and topography on artificial spin ice (data courtesy: Prof. S. Ferreira). Scan size: 4 x 4 µm². Topography (left) and KPFM signal (right) of CVD grown MoS2 crystals. Scan size: 42 x 42 μm²; Zrange: 9 nm; KPFM range: 1.45 V. . Amplitude (left) and phase (right) of dS/dV (dC/...

Sample Heating Advanced Spectroscopy Scanning Thermal Microscopy Motorized Translation Stage Environmental Control Scripting Interface Acoustic Enclosure Relative Humidity Variable Magnetic Field Inverted Microscope Stage Advanced Lithography Motorized Inverted Microscope Stage Contour Following Mode Petri Dish Petri Dish Heating Digital Inverted Microscope Coverslip Holder Advanced Optics KPFM Mode Spotting Nanolithography SICM Single Cell Injection Single Bacteria Adhesion Single Cell Extraction Single Cell Isolation Single Cell Adhesion Colloidal Spectroscopy [email protected] www.nanosurf.com...