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Alphacen 300 - Tip-scanning AFM for heavy and large samples up to 300 mm

Alphacen 300 - Tip-scanning AFM for heavy and large samples up to 300 mm
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Alphacen 300 - Tip-scanning AFM for heavy and large samples up to 300 mm - 1

Alphacen 300 Next-Level Nanotechnology Tools swiss quality The tip-scanning AFM for heavy & large samples up to 300 mm

Alphacen 300 - Tip-scanning AFM for heavy and large samples up to 300 mm - 2

Handle heavy samples with ease thanks to tip scanning and air bearings Heavy samples demand special handling: the Alphacen 300 can move samples up to 45 kg virtually frictionless with a repositioning accuracy of 2 pm thanks to the employed air bearings. The sample stage is lifted up using pressurized air or nitrogen, and high-precision belts move it as required. Once the area of interest on the sample is reached, the air pressure is released, putting the sample in position for measurement without stage drift. For scanning Alphacen 300 uses tip-scanning technology, keeping the size and...

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Alphacen 300 - Tip-scanning AFM for heavy and large samples up to 300 mm - 3

Nanosurf GmbH Langen, Germany +49 6103 202 7163 Nanosurf Inc. Woburn, MA, USA +1 781 549 7361 Santa Barbara, CA, USA +1 805 696 3938 Nanosurf Nanosurf China, Shanghai ±;W^^S£578^ (200086) +86 18621896399 Nanosurf India New Delhi, India +91 92 0552 0378 Nanosurf Singapore 574827 Singapore +65 9839 9938 info@nanosurf.com www.nanosurf.com Nanosurf and the Nanosurf Logo are trademarks of Nanosurf AG Copyright © 2019 Nanosurf AG, Switzerland

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