Introduction
The Alphacen 300 is a tip-scanning Atomic Force Microscope (AFM) designed for handling large and heavy samples up to 300 mm in size and 45 kg in weight. Developed by Nanosurf, it leverages extensive experience in custom systems to offer a standard product that reduces cost and delivery time.

Specifications
The system features a sample stage with a 300 mm x 300 mm XY travel range, extendable to 500 mm on request, and a Z-stage travel of 50 mm. It offers a resolution of 1 µm and a positioning accuracy of 2 µm. The maximum sample size is 300 mm x 300 mm x 45 mm, with a weight limit of 40 kg. The system dimensions are 1008 mm x 1887 mm x 1208 mm, and it weighs 833 kg.

Capabilities
The Alphacen 300 is equipped with automation software for pre-programming measurement series, allowing for efficient data collection without user intervention. It uses air bearings for frictionless movement of heavy samples and employs tip-scanning technology to minimize the size and weight of moving parts.

Imaging and Measurement
The system supports various imaging modes, including static and dynamic force, phase contrast, and more. It offers spectroscopy modes like force-distance and amplitude-distance, with a setup wizard for ease of use. The scanner specifications include a maximum XY scan range of 100 µm and a Z-range of 10 µm, with low noise levels for precise measurements.

Controller and Communication
The CX Controller features high-resolution outputs and inputs, fast signal processing, and communication via Gigabit Ethernet. It includes a system-on-chip module with FPGA signal processing and dual-core ARM processor.

Additional Features
The system is housed in an acoustic enclosure with side view cameras for easy sample navigation. It provides active vibration isolation and acoustic isolation of ~30 dB above 250 Hz.

Contact Information
Nanosurf has offices in Switzerland, Germany, the UK, the USA, China, India, and Singapore. Contact details are provided for each location.