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ANTENNA MEASUREMENT AND RADOME TEST SYSTEMS CATALOG

MVG, the Broadest Choice of Antenna Test f Antenna Measurement and Radome Testing Systems P. 021 Advanced Positioners with Goniometers • Compact Range 3.1 Measurement Control, Acquisition and Post Processing P. 133 3.2 Advanced Post Processing P. 137

This edition of the MVG antenna measurement and radome testing systems catalog presents all of our turn-key measurement systems under one cover. nside this catalog, you will find technical and mechanical information concerning our systems, allowing you to easily determine the system that best suits your needs. On the next page, you'll find a Quick Guide of MVG's solutions synthesizing the most important features and guiding you to the detailed pages of the system of your choice thereafter. An important part of our turn-key offer is the accompanying software. A section of this catalog is...

Quick Guide of MVG's solutions System name • inear array L antenna measurement • MIMO measurement • inear array antenna L measurement • inear array antenna L measurement • TIA certifiable C measurement • G 64 - Compact, S SG 64 - Standard and SG 64 - Large: 400 MHz to 6 GHz • Near-field / Spherical Frequency bands • Near-field / Cylindrical • 00 MHz to 6 GHz 4 (depending on the specification of the spatial channel emulator) • epending on D the number of probes • 0 times faster than 1 standard • 0 times faster than 1 standard • 0 times faster than 1 standard • 0 times faster than 1 standard...

Starbot 4200 Starbot 4300 • adar antenna R testing • inear array antenna L measurement • adar antenna R testing • ub-system antenna S measurement • ircraft/ vehicle A in situ antenna characterization • ystem optimized S for X band but customizable from 70 MHz to 18 GHz (up to 40 GHz with single-probe) • ystem optimized S for S band but operational over 1 to 6 GHz or 1 to 18 GHz • 0 times faster than 1 standard • 0 times faster than 1 standard • 0 times faster than 1 standard • 0 times faster than 1 standard • 0 times faster than 1 standard • 0 times faster than 1 standard

System name Compact Range • iniature M connectorized antenna measurements • easurements of M laptops and other devices • Near-eld / Spherical • Production testing • Compact Range • hased array P antenna testing • ear-field focused N antenna testing, • igh gain antenna H testing • hased array antenna P measurement • ear-eld focused N antenna testing • rray illumination A assessment • rray element failure A analysis • Near-field / Planar • ptional: O Near-field / Spherical Near-field / Cylindrical • illimeter wave M applications • igh gain antenna H testing • rray illumination A assessment •...

System name • ntenna A measurement • ulsed measurement P • ntenna A measurement • ulsed measurement P • hased array P antenna measurement • hased array P antenna measurement Quick guide to evaluate scan area requirement for planar and cylindrical measurement The required scan area is calculated according to the following formula: Scan length = D + 2 L tg ( ) Frequency bands Max size of DUT Antenna directivity • ingle-probe: S 200 MHz - 18 GHz, divided in sub-bands (up to 40 GHz upon request) • ulti-probe: M 800 MHz - 18 GHz • ulti-probe: M 70 - 800 MHz upon request • ulti-probe: M 400 MHz -...

MVG, the Broadest Choice of Antenna Test and Measurement Solutions The Microwave Vision Group (MVG) incorporates the technical expertise, product portfolios and infrastructures of four industry leaders: SATIMO, ORBIT/FR, AEMI and Rainford EMC. Combining our strengths, we are dedicated to developing turn-key antenna measurement sytems capable of meeting customer specific needs. We are committed to serving you through 18 offices worldwide, where you’ll find our sales, project management and customer support teams locally at your convenience. COMPREHENSIVE PRODUCT RANGE CUTTING-EDGE...

COMPREHENSIVE PRODUCT RANGE From components and parts to full turn-key solutions, the right combination enables you to meet your specific measurement needs in a variety of testing configurations. Our offer allows you not only the facility of finding suitable off-the-shelf products, it also guarantees an upgrade path to enhance system capability. MVG products are grouped into several families: • Absorbing materials: pyramidal, wedged, convoluted; standard, clean room absorbers, rubberized absorbers, HP absorbers; walkways • Multi-probe arrays: Starlab, StarMIMO, SG 24, SG 32, SG 64, SG 128,...

CUTTING-EDGE TECHNOLOGIES The advanced technology in MVG systems supports our customers in their drive to innovate. Our aim: to give you a sharper edge and faster ROI (Return on Investment). The speed and accuracy of our systems stems from two cutting-edge technologies: 1. MV-ScanTM Technology 2. Advanced Precision Electro-mechanical Technology 1/ MV-SCANTM TECHNOLOGY: FAST - ACCURATE - SMART MV-ScanTM Technology is integrated into all our multi-probe systems. With MV-ScanTM, an array of probes is electronically scanned, increasing measurement speed while also gaining in measurement...

recise knowledge of our systems’ error budget P Knowing the error budget is essential for predicting the accuracy and repeatability of a system. Each of our systems undergoes a validation process where the error budget is determined for reference during installation and maintenance. Traditional single probe spherical configuration Theta axis Test antenna Phi axis omparison studies C a second measure in system validation, we As perform comparison tests in different types of ranges (near-field, far-field, compact ranges, etc.). The results of these studies allow us to obtain the data...

Smart The use of probe-arrays reduces the number of probe/DUT positions necessary to complete a test. This results in fewer mechanical movements. In addition, we offer a choice of geometries as well as different types of arrays to allow you to attain the most efficient configuration. Mechanical movements are thus minimized and speed and accuracy are maximized. The right geometry for your application array of probes can be integrated into different system An architectures. • Spherical geometry (SG systems – SG 24, SG 32, SG 64, etc.): Tests any type of antenna. Necessary for OTA testing or...