ML7128E-LFX-UMT Universal Module Tester | 128 total Channel | Replaceable 4 daughter cards with 2 slots in each | Passive and Active Interconnect Testing | Long Reach BERT | 3 or 9dB loss | Ethernet Rates | BER Testing The ML7128E-LFX-UMT is a versatile, high-performance universal module tester designed for quick and efficient testing of both active and passive interconnects. Featuring a long-reach Bit Error Rate Tester (BERT) with 128 channels, this tester supports a maximum data rate of up to 112G per lane. The ML7128ELFX-UMT utilizes a modular design with replaceable daughter cards, enabling flexible and quick configurations for production environments. The ML7128E-L-UMT includes Feed-Forward Equalization (FFE) in 3 or 7 taps mode on the transmitter (Tx) side, and Continuous-Time Linear Equalization (CTLE) and Decision Feedback Equalization (DFE) on the receiver (Rx) side. These features ensure comprehensive testing and optimization of signal performance, making the ML7128E-LFX-UMT an ideal solution for rapid testing in production environments, ensuring the highest levels of interconnect quality and reliability.

128 x 66 GBaud PAM4 BERT Introduction The ML7064E-L-UMT is a fully featured 112G/lane Tester that can be configured for 128 channels, one system needs 4x daughter cards to be fully loaded, you can mix and match each adjacent daughter cards between the options figuring in order information. Each system contains 2 modules, with 64 channels each, making it a total of 128 channels per system. Each 2 adjacent daughter cards must be configured to run at the same rate The transmitters support all standard test patterns mandated by IEEE802.3ck stress testing and OIF such as PRBS13Q, PRBS31Q, etc. Tx...

Mechanical Modularity Concept: Our innovative design features fast and reliable daughter card replacement after a specific number of insertions, ensuring minimal maintenance interruptions. The daughter card is securely fixed to the main PCB using a robust board-to-board connection, enhanced by captive screws for secure attachment and easy removal. This setup is ideal for environments requiring continuous operation, facilitating quick component swaps, improving work efficiency, and reducing disruptions during the production phase. Remove the L shaped cover and the cooling cage at once: Unscrew...

1 With appropriate pre and post emphasis settings and 50 GHz scope with internal CDR. Trigger from adjacent data channel rate/8

Mechanical Dimensions ML7064E-L-UMT can be used as a benchtop instrument or fit in a 1RU Rack Different testers can be stacked on top of each other’s Figure 1: ML7064E-L-UMT Mechanical Dimensions

Please contact us at [email protected]