ML7064E-L-UMT Universal Interconnect Tester | 64 total Channel | Replaceable 4 daughter cards with 2 slots in each| Equalization | Passive and Active Interconnect Testing | Long Reach BERT | Additional 3 or 9dB loss | Ethernet Rates | BER Testing The ML7064E-L-UMT is a versatile, high-performance universal interconnect tester designed for quick and efficient testing of both active and passive interconnects. Featuring a long-reach Bit Error Rate Tester (BERT) with 64 channels, this tester supports a maximum data rate of up to 112G per lane. The ML7064EL-UMT utilizes a modular design with replaceable daughter cards, enabling flexible and quick configuration suitable for production environments. Equipped with advanced signal integrity analysis capabilities, the ML7064E-L-UMT includes Feed-Forward Equalization (FFE) in 3 or 7 taps mode on the transmitter (Tx) side, and Continuous-Time Linear Equalization (CTLE), Decision Feedback Equalization (DFE), reflection cancellation (RC), and Maximum Likelihood Sequence Detection (MLSD) on the receiver (Rx) side. These features ensure comprehensive testing and optimization of signal performance, making the ML7064E-L-UMT an ideal solution for rapid testing in production environments, ensuring the highest levels of interconnect quality and reliability.

• Available patterns: PRBS15Q, PRBS23Q, PRBS31Qand PRBS58Q, plus their inversions o Square wave • Burst noise injection The ML7064E-L-UMT is a fully featured 112G/lane Tester that can be configured for 64 channels, one system needs 4x daughter cards to be fully loaded, you can mix and match between the options figuring in order information The transmitters support all standard test patterns mandated by IEEE802.3ck stress testing and OIF such as PRBS13Q, PRBS31Q, etc. Tx can also be programed to output a user-defined pattern. The ML7064E-L-UMT supports transmitter and receiver equalization up...

Mechanical Modularity Concept: Our innovative design features fast and reliable daughter card replacement after a specific number of insertions, ensuring minimal maintenance interruptions. The daughter card is securely fixed to the main PCB using a robust board-to-board connection, enhanced by captive screws for secure attachment and easy removal. This setup is ideal for environments requiring continuous operation, facilitating quick component swaps, improving work efficiency, and reducing disruptions during the production phase. Remove the L shaped cover and the cooling cage at once: Unscrew...

Specifications Parameter

Mechanical Dimensions ML7064E-L-UMT can be used as a benchtop instrument or fit in a 1RU Rack Different testers can be on top of each other’s Figure 3: ML7064E-L-UMT Mechanical Dimensions

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