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Hyper-Scale Testing for the Terabit Era

Hyper-Scale Testing for the Terabit Era
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Hyper-Scale Testing for the Terabit Era

Product catalog summary
Overview: The 2025 Product Brochure by MultiLane outlines their comprehensive solutions for hyper-scale testing in the Terabit era, focusing on products and services such as loopbacks, CMIS management, testing instruments, and engineering services tailored for high-speed networks.
Product Evolution: Over the past decade, MultiLane has introduced significant products like the OSFP-XD Toolkit, Hyperscaler Compliance Services, and the CMIS 800G Nexus Analyzer, showcasing their commitment to innovation in high-speed network testing.
224Gbps Signal Integrity Characterization: MultiLane presents new products for 224Gbps signal integrity characterization, including the OSFP 224G MCB and the ML4067-224 Channel Emulation Board, aimed at validating next-gen pluggables and testing responses to lossy channels.
Data Center Test Solutions: MultiLane provides solutions for data center testing, focusing on 1.6T host ports and next-gen pluggables, supporting compliance and interoperability validation with features like high-performance signal integrity traces and thermal load testing.
Nexus Analyzer: This tool is designed for CMIS/SFF implementation validation, offering features such as state machine testing, I2C R/W commands, and packet analysis, supporting various form factors to simplify CMIS testing.
Channel Emulation Boards: The ML4067 series simulates lossy signals for design characterization in real-world environments, supporting 112Gbps/lane and 224Gbps/lane testing with precise inter-symbol interference for stress testing.
Active Loopbacks: MultiLane's DSP-based Active Loopbacks are designed for complex characterization techniques required for 800G host ports, offering features like BER/SNR diagnostics and PRBS generation to enhance testing efficiency.
Measurement Solutions: MultiLane's MultiWave Test Platform offers a flexible solution for various testing applications, supporting up to 224Gbps/lane BERT testing and ultra-high-density interconnect validation.
Ultra-High-Throughput Copper Validation: The ML7064E-LX BERT provides rapid, comprehensive testing for high-density copper interconnects, supporting up to 64 channels per unit at 112Gbps/lane.
Customizable Mechanical Enclosure: Supports various Ethernet rates including 53.125Gbaud, with the ML7032F-LX featuring up to 32 channels per module and supporting up to 224Gbps/lane, available August 2025.
Measurement Solutions: The ML8008FX-SIA Signal Integrity Analyzer is optimized for validating passive copper solutions, supporting a wide range of signal integrity measurements, ideal for high-volume production environments.
Universal Module Tester: The ML7064E-L-UMT and ML7128E-LFX-UMT offer 4-channel BERT capabilities, covering up to 120Gbaud PAM4 and 120Gbit/s NRZ, with extensive equalization and monitoring features.
ML7004F-L BERT: A versatile 4-channel 224Gbps/lane BERT, suitable for R&D and production, with up to 40 dB of Rx equalization, supporting scalability with the Multiwave Test Platform (MWTP).
Oscilloscope GUI: Designed for the latest MultiLane DSOs, the GUI emphasizes clarity and user-friendliness, developed with customer feedback.
ML4015E DSO: A fully-featured DSO for 1G to 800G network testing, with enhanced hardware options for low intrinsic noise and jitter reduction.
ML6002-70-E DSO: A compact two-channel electrical DSO with a 70GHz bandwidth, suitable for 224Gbps/lane applications, featuring comprehensive software libraries for automated testing.
Integrated Stressed Receiver Testing: MultiLane's SITOL methodology integrates ITOL, JTOL, and margin testing to ensure designs meet 112G/lane PAM4 ecosystem requirements.
ML4079E and ML4079EN BERTs: 800G BERTs with real hardware FEC analysis and stress testing capabilities, supporting dense M-SMPM connectors.
MultiLane Pulsar: A 4-channel Time Domain Reflectometry analyzer for troubleshooting and high-throughput testing of high-density ports.
ML4081 and ML4081-X: AWGN injector and Pick off-Tee board for noise effect analysis on signal BER and eye diagrams.
ML4035 3-in-1 Tester: Offers 400G BERT, TDR, and DSO capabilities in one compact package, suitable for high-throughput cable testing.
Arbitrary Waveform Generators: The ML9004F delivers a 150GSa/s sample rate for high-speed SerDes transceiver and amplifier validation.
MultiLane Cable Testers: Fastest on the market, capturing S-parameter measurements on 16 differential lanes, optimized for high-volume manufacturing.
Engineering and Test Services: MultiLane offers a range of engineering and testing services, including compliance testing, interoperability services, and custom engineering solutions.
High-Performance Cable Assemblies: The document details high-performance cable assemblies, connectors, and adapters for high-frequency applications up to 110 GHz, manufactured in the USA and Lebanon.
Coax Cable Assemblies: Available in various lengths, these assemblies are customizable for high-density applications, supporting a frequency range of DC to 110 GHz.
SMPM Interconnects: Designed for applications with strict design density limitations, these connectors support DC to 67 GHz, suitable for semiconductor development and testing environments.
Adapters and Terminators: Supporting frequencies up to 110 GHz, these components are available in various connector interfaces and configurations, rated for 500 mating cycles.
RF Jumpers: Available with precision connector interfaces, offering phase-stable assemblies in standard lengths, customizable for specific needs.
Customization and Contact: The document emphasizes customization options for various products and encourages contacting the factory for specific requirements.
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Catalog excerpts

Hyper-Scale Testing for the Terabit Era-1

Hyper-Scale Testing for the Terabit Era

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Hyper-Scale Testing for the Terabit Era-2

This brochure reflects the full diversity of MultiLane solutions, from Loopbacks and CMIS management, testing instruments, personalized engineering services, to creating the building blocks for our products with our new interconnects, we have cast a wide net while maintaining our exceptional quality to ensure we can continue to meet and exceed market expectations. Happy browsing! Our journey of growth over the past ten years to meet the rising demands of high speed networks. First Interconnects & 10G BERT Hyperscaler Compliance Services 112G spurs Loopback Evolution 4,000+ Loopbacks Weekly 112G...

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Hyper-Scale Testing for the Terabit Era-3

ACCELERATING HIGH-SPEED ADOPTION ACROSS THE INDUSTRY MultiLane Data Center Test Solutions offer an extensive selection of testing capabilities to enable the modern day data center. We have ready solutions for the most dominant form factors across many generations. Our focus is on the specialized tools that allow for the development of 1.6T hosts ports and next-gen pluggables; accelerating both the current and next generation of Giga/Terabit ethernet.

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Hyper-Scale Testing for the Terabit Era-4

As the race to 224Gbps/lane heats up, MultiLane stands ready to accelerate the development and adoption of this latest technology with three new products in 224Gbps Signal Integrity characterization. Taken together, these products offer a compliance and development suite to accelerate vital R&D for next-gen networks. The latest MultiLane Channel Emulation Board, the ML4067-224 provides a comprehensive set of trace paths for 224Gbps signals to test and validate responses to lossy channels. With 11 traces at 92 and another 11 traces at 100 Ohms the ML4067-224 can emulate losses which range from...

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Hyper-Scale Testing for the Terabit Era-5

Data Center Test Solutions MultiLane’s line of OSFP-XD Host and Module Compliance Boards (HCBs and MCBs) are ready to accelerate the industry into the Terabit generation. The ready-to-ship ML4064-XD-MCB-112-MXPM70 provides a means of testing very early OSFP-XD pluggables, while the ML4064-XD-HCB1/2-112 and its series of high-performance SI traces allow for early port characterization/testing. Both test fixtures are compliant with the CEI-56G-VSR-NRZ and IEEE 802.3ck specs. ML4064-XD-MCB-112-MXPM70 Key Features • MCB loss including the 3” MXPM70 cable is compliant with CEI-56G-VSR-NRZ and IEEE...

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Hyper-Scale Testing for the Terabit Era-6

Data Center Test Solutions Nexus Analyzer As new CMIS standards are developed and adopted, with a wide variety of SFF and CMIS specs available, CMIS testing becomes increasingly complex and time consuming. The MultiLane Nexus Analyzer is a direct response to this complexity, designed with speed and simplicity at its core. A CMIS/SFF debug tool for interoperability testing and CMIS/SFF failures, the Nexus Analyzer is equipped with a full feature sweep implemented in its GUI. The Nexus Analyzer is used as a verification tool to validate the CMIS/SFF implementation, with a CMIS/SFF register sweep,...

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Hyper-Scale Testing for the Terabit Era-7

Data Center Test Solutions Nexus Analyzer Adapter Analyzer • SI traces and connector support 112G rates • Current and temperature sensor • Module power ripples and inrush current measurement • Detection of power spikes during module state transitions • Probing interface for Vcc and GND pins • Dip switch to choose low-speed signal source: internal/external • Available in all SFF/CMIS form factors • Voltage sensor • ePPS signal validation • Probing interface for low-speed signals • External control for any low-speed signal: • LEDs for control/alarm signal status • USB port for PC connection to...

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Hyper-Scale Testing for the Terabit Era-8

Data Center Test Solutions The move to 800G brings with it a paradigm shift in loopback design. The complex characterization techniques required for host ports at 8x112Gbps necessitate the advent of a new generation of loopbacks to address these challenges. MultiLane’s Active Loopbacks are DSP-based modules designed specifically to account for these complex characterization techniques, while also covering the established requirements - thermal management and CMIS interoperability - for host port testing. • Thermal Emulation • PRBS Generator • BER/SNR Diagnostics • Gray Mapping supported • 800G...

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Hyper-Scale Testing for the Terabit Era-9

Data Center Test Solutions MultiLane’s Data Center DevKits provide an all-in-one solution for network testing and design. Each kit contains the appropriate module/host compliance board, loopbacks, and CMIS analyzers for Module, Host, or Compliance testing across 6 form factors supporting speeds from 50 to 800G. QSFP-DD | OSFP | QSFP | DSFP | SFP-DD | SFP ML4062-MCB-112: Module Compliance Boards test any pluggables in their respective form factor. They validate the compliance, signal transmission, and any other feature the pluggable has. They also test the thermal capability of modules and can...

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Hyper-Scale Testing for the Terabit Era-10

LEADING INSTRUMENTS FOR A MULTITUDE OF USECASES A core competency at MultiLane, our Measurement Solutions offer a diversity of instruments for equally diverse applications, from 224Gbps/lane BERT testing, to ultra-high-density interconnect validation, to enhanced signal capture with MultiLane DSOs, to our PAM8-capable AWG. Many MultiLane solutions can be fitted to the MultiWave Test Platform offering customers a completely tailored solution to cover almost any testing requirement. multi Lane.

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Hyper-Scale Testing for the Terabit Era-11

The MultiWave Test Platform (MWTP) is the latest measurement solution from MultiLane, with top-tier performance and flexibility across a wide variety of testing applications. Using the latest MultiLane Mirage Enclosure, the MWTP can house up to 6 different instruments in a single rack unit - for both data center and benchtop environments -offering a range of solutions suited to any testing need. The MWTP provides the perfect balance of flexibility and ease of use. The expanded enclosure allows any combination of MultiLane instruments to be placed into a custom-built MultiWave Test Platform for...

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Hyper-Scale Testing for the Terabit Era-12

Measurement Solutions Next-Gen Measurement Solutions Ultra-High-Throughput Copper Validation Copper remains a vital component of current and next-gen networks, with high-density copper interconnects key components in AI clusters. With thousands of differential pairs and even a single point of failure capable of bringing down an entire system, rapid, comprehensive testing is essential. Given the critical issues of reliability, cost, and scale that have come to define this generation of network technology, MultiLane has found that Bit Error Rate Testers (BERTs) serve as more effective solutions than...

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All MultiLane catalogs and technical brochures

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  2. ML7064E-L-UMT

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  4. ML4039E

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  5. ML4039D

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  6. ML4039B

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  7. ML4039-BTP

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  8. ML4039E-ATE

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  9. ML9004E

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  10. ML4035

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  11. ML4015E

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  12. ML4025E-PLS

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  13. ML4025F-PLS

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  14. ML4079ELN

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  15. ML4079EN

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  16. ML4079E

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  17. ML4079D

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*Prices are pre-tax. They exclude delivery charges and customs duties and do not include additional charges for installation or activation options. Prices are indicative only and may vary by country, with changes to the cost of raw materials and exchange rates.