A worldwide leader in precision measurement solutions 76-300 mm wafer diameters High-resolution LCD display Menu-driven for fast, easy setup 5-point, TTV and bow measurements Ethernet and RS232 computer interface Wafer Measurement Systems for Semiconducting and Semi-insulating Wafers Front USB interface for easy data storage Up to 1700µm measurement range Cost-effective alternative to fully-automated wafer inspection systems

Using MTI's proprietary non-contact capacitance probes, the Proforma 300/ is fast, accurate and reliable. The Proforma 300/ is capable of measuring wafer up to 300mm in diameter for thickness, total thickness variation (TTV) and bow. Bubble Level Proprietary Push-Pull™ probe technology Pin guides provide centering of industry standard round wafer sizes — Menu driven interface Adjustable stage for precise leveling I T he OEM model consists of the acquisition system and probes only. As such, several parameters will be dependant on the custom installation parameters. Contact MTII nstruments to discuss...