Catalog excerpts
INTERFEROMETER VI-direct Universal Interferometers for Quality Control
Open the catalog to page 1INTERFEROMETER VI-direct Ideal for Production and Quality Control Interferometers are an indispensable measurement tool for optical production and quality control. They are used for a wide variety of applications. Examples are testing of flatness and sphericity of optical surfaces, radius measurement and the testing of the wave-front of optical systems. Features and benefits of the product line Interferometer VI-direct: n n n n n n n Working principle: Fizeau-Interferometer Cost effective alternative to conventional interferometers Digital camera with high lateral resolution (3088 x 2076...
Open the catalog to page 2INTERFEROMETER VI-direct Typical Applications Flatness Measurements of Surfaces This setup is used for the measurement of surface flatness of plane elements such as mirrors, prisms and windows. For this set-up a transmission flat, a mount for the specimen (e.g. a self-centering holder) and a 2-axes adjustable mount are required. Wave-front and Wedge Angle Measurements of Plane Elements This setup is used for the measurement of the wave-front deviation of plane elements and for wedge angle measurements. For this set-up two transmission flats, possibly a mount for the specimen (e.g. a...
Open the catalog to page 3MICRO-INTERFEROMETER VI-direct With Clear Aperture 3.6 mm Description Micro-Interferometer VI-direct Laser He-Ne laser (non-stabilized) The Micro-Interferometer VI-direct extends the range of flatness testing to the domain of small diameters. The Fizeau-type interferometer is able to measure the surface flatness of optical parts like micro-prisms, laser crystals, fiber endings, etc. with diameters between 0.8 mm and 3.6 mm. Included in the delivery is a non-stabilized fiber coupled He-Ne laser (λ=632.8 nm). Direct connection to PC/Laptop via USB 3.0 port, no frame grabber required Digital...
Open the catalog to page 4Typical Samples Fiber ends Micro prisms Optical Accessories Description Transmission flat D30; λ/30 p-v Mechanical Accessories Description Art. No. Vertical stand D40 223 108 with tilting table Vertical stand D40 223 165 with tilting table and phase shifting unit |05
Open the catalog to page 5INTERFEROMETER VI-direct With Clear Aperture 10, 16 and 28 mm L=65 for direct 10 for direct 16 L=118 for direct 28 Description Interferometer VI-direct 10 Interferometer VI-direct SL 10 Interferometer VI-direct 16 Interferometer VI-direct SL 16 Interferometer VI-direct 28 Interferometer VI-direct SL 28 Laser He-Ne laser (non-stabilized) He-Ne laser (stabilized) He-Ne laser (non-stabilized) He-Ne laser (stabilized) He-Ne laser (non-stabilized) He-Ne laser (stabilized) The Interferometers VI-direct with clear aperture 10, 16 and 28 mm are able to measure flats with a diameter of 3 to 28 mm...
Open the catalog to page 6Optical Accessories Description Transmission flat D16; λ/30 p-v Transmission flat D28; λ/30 p-v Description Adapter M36 x 0.75 on bayonet D70 Info: The interferometers can also be operated with transmission spheres and flats of other manufacturers, e.g. by using the adapter M36 x 0.75 on bayonet D70 (other adapters on request). Mechanical Accessories Description Art. No. Height adjustable 223 151 vertical stand D40 with tilting table Height adjustable 223 155 vertical stand D40 with XY- and tilting table Height adjustable 223 159 vertical stand D40 with XY- , tilting table and phase...
Open the catalog to page 7INTERFEROMETER VI-direct With Clear Aperture 50 mm Description Interferometer VI-direct 50 Interferometer VI-direct SL 50 Laser He-Ne laser (non-stabilized) He-Ne laser (stabilized) The Interferometer VI-direct with clear aperture 50 mm is able to measure flats with a diameter of 12 to 50 mm and spheres with diameter depending on selected transmission sphere. Included in the delivery is a fiber coupled He-Ne laser (λ=632.8 nm). Direct connection to PC/Laptop via USB 3.0 port, no frame grabber required Digital camera with high resolution (3088 x 2076 pixel) Insensitive to vibrations due to...
Open the catalog to page 8Optical Accessories Info: An overview of suitable transmission spheres can be found on page 12. Transmission spheres with other radii are available on request. The interferometers can also be operated with transmission spheres and flats of other manufacturers, e.g. by using the following adapter (other adapters on request). Mechanical Accessories DescriptionArt. No. Height adjustable 223 153 vertical stand D65 with tilting table Height adjustable 223 157 vertical stand D65 with XY- and tilting table Height adjustable 223 161 vertical stand D65 with XY-, tilting table and phase shifting unit...
Open the catalog to page 9INTERFEROMETER VI-direct With Clear Aperture 100 mm Description Interferometer VI-direct 100 Interferometer VI-direct SL 100 Laser He-Ne laser (non-stabilized) He-Ne laser (stabilized) The Interferometer VI-direct with clear aperture 100 mm is able to measure flats with a diameter of 25 to 100 mm and spheres with diameter depending on selected transmission sphere. Included in the delivery is a fiber coupled He-Ne laser (λ=632.8 nm). Direct connection to PC/Laptop via USB 3.0 port, no frame grabber required Digital camera with high resolution (3088 x 2076 pixel) Insensitive to vibrations due...
Open the catalog to page 10Info: By the combination of an optical connector with a transmission sphere, the innovative transmission sphere system allows a considerably increased measurement range and a 60% superior illumination compared to classical transmission spheres. One optical connector is needed. It can be combined with all transmission spheres. The principle and a selection guide are shown on page 13. The use of transmission spheres of other manufacturers is possible, too. DescriptionArt. No. Vertical stand D128 223 110 with tilting table Vertical stand D128 223 171 with XY- and tilting table Vertical Stand...
Open the catalog to page 11INTERFEROMETER VI-direct Choice of Transmission Sphere For testing of spherical surfaces so called transmissions spheres are used. These generate a reference wave which can be tested against a spherical sample interferometrically. Transmission spheres are available with different radii (R (Fizeau) ) and usable diameters (D (Fizeau) ). To measure the whole spherical surface under test the following condition must be fulfilled: /D (Fizeau) ≤ R/D (surface under test) For the best choice of transmission spheres for respective measuring tasks the following graphics and tables can be used....
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