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Contaminant Particle Analysis

Contaminant Particle Analysis

Product catalog summary

Contaminant Particle Analysis Overview

The document discusses an original detection algorithm designed for analyzing contaminant particles. This algorithm is capable of detecting, classifying, and measuring particulates within 5 seconds per image. It highlights the flexibility of the system, noting that other classification schemes, such as those based on shape, are possible. Additionally, the document mentions the availability of various size and shape metrics that can be utilized for more detailed analysis.

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Catalog excerpts

Contaminant Particle Analysis-1

Contaminant Particle Analysis Original Algorithm (recipe) detects, classifies, and measures particulates in 5 sec per image Other classification schemes possible (e.g., shape-based) Many other size and shape metrics available

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