Laboratory Instruments, si725
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ooooo oooooo Optical Sensing Analyzer | si725 i088o§o0888o8 • Full Spectrum Measurements of fiber Bragg grating (FBG), extrinsic Fabry- Perot, long period grating (LPG), and other optical sensor components • Continuous long-term health monitoring of bridges, dams, buildings, tunnels, ships, aircraft, trains, and other complex • Development of fiber optic sensors and • High accuracy absolute measurements of strain, temperature, displacement, pressure and other static sensors • On-board NIST traceable wavelength • Wide wavelength swept laser support- ng more sensors per channel • Included ENLIGHT eases configuration, data acquisition, and on-board data • Intuitive touch screen user interface for easy configuration and visualization of monitoring application • Civil structures/civionics (bridges, dams, tunnels, mines, buildings) • Energy (wind turbines, pipelines, nuclear reactors, solar panel forms) • Oil & gas (well reservoir management, platform structural health monitoring, pipeline condition) • Aerospace vehicles (airframes, compos- ite structures, wind tunnels, dynamic • Marine vessels (hull, mast, rudder, deck, cargo containers) • Transportation (railways, trains, road- ways, specialty vehicles, cranes) • Homeland security (perimeter intrusion, heat detection, security gate monitor- The si725 is a convenient, full-featured static optical sensor interrogation instrument, powered by ENLIGHT and featuring up to 16 internal fiber measurement channels, a large 17" touch screen LCD, and is ideally suited for laboratory use The si725 Optical Sensing Interrogator is built upon the Micron Optics x25 optica sensor interrogator core, featuring a high power, low noise swept wavelength laser, realized with Micron Optics patented Fiber Fabry-Perot Tunable Filter technology. The x25 interrogator core employs full spectral scanning and data acquisition, providing measurements with high absolute accuracy, flexible software post-processing, and high dynamic range performance. x25 based interrogators support continuous on-board NIST traceable wavelength reference components and are ideally suited to measure many different optical sensor types, including FBGs, long period gratings, extrinsic Fabry-Perot sensors, and many others. Well over half of the fiber optic sensors deployed today are measured with instrumentation that uses Micron Optics technology. The Micron Optics "si - Sensing Instrument" platform features an optimized Integrated ENLIGHT environment built on Windows XP Embedded technology. In contrast with the "sm - Sensing Module" platform, Sensing Instruments support on-board manage- ment of all optical interrogator core configuration, data acquisition, sensor calibration, data visualization, and data storage tasks. Users of Integrated ENLIGHT interface to the Sensing Instruments through a touch screen LCD, external keyboard/mouse/monitor, or Windows Remote Desktop connections ENLIGHT combines the useful features of traditional sensor software with the specific tools needed to optimize optical properties during the design, implementation, and operations phases of an optical sensor system. Tables, graphs, and additional data visualization features make ENLIGHT easy to use. Learn more about ENLIGHT at http:// Products displaying the " Micron OpticsTuned" logo include Micron Optics tunable technologies insuring high quality and performance

ooooo ooooo Optical Sensing Analyzer | si725 1. Beta product. For details see www.micronoptics.com/product_designation.php. 2. Per NISTTechnical Note 1297, 1994 Edition, Section D.I.1.1, definition of "accuracy of measurement". 3. Captures effects of long term use over full operating temperature range of the instrument. 4. Per NISTTechnical Note 1297, 1994 Edition, Section D. 1.1.2, definition of "repeatability [of results of measurements]". 5. Defined as laser launch power minus detection noise floor. 6. Assuming nominal wavelength range of +/- 2nm per FBG sensor. Micron Optics, Inc. phone...