cad

Fading Test System
1Pages

{{requestButtons}}

Catalog excerpts

Fading Test System - 1

100 Phone: 1-800-222-6440 • Fax: 1-949-253-1680 L i g h t S o u r c e s TECHNICAL REFERENCE MONOCHROMATOR AND INCANDESCENT SOURCES ARC SOURCES DEUTERIUM SOURCES CALIBRATION SOURCES FIBER ILLUMINATORS PHOTOLITHOGRAPHY SOLAR SIMULATORS INSTRUMENTS ACCESSORIES FOR ORIEL LIGHT SOURCES Oriel Fading Test System Scientists at Carnegie Mellon University have been using the Oriel Fading System to test artifacts from museum, library and archival collections. The Oriel Fading Test System is the result of scientists at Carnegie Mellon University developing a method for testing light - induced fading of museum artifacts, with an Oriel Light Source and Components. This testing method was then replicated by other Conservationists. Here we describe the application, which we offer as a complete system under model 80190 Fading Test System. Light-induced fading is considered to be one of the more serious threats to artifacts. It can cause disfiguration and permanent alteration to the artifact. The 80190 Fading Test System from Newport provides rapid "screening" of the colorants present on artifacts and aids in identifying those having extreme sensitivity in the visible wavelength region. Recent field tests also indicate that the System can be used to predict color changes that would result from light exposure in particular exhibition conditions. Another useful application is to predict the longevity of a good color match for an artifact retouch. The system is particularly useful for testing the effects of exhibition lighting on newly acquired artifacts, such as archeological finds or modern art, or to test objects that will undergo changed light conditions. Most importantly, these tests are conducted without perceptible change in color to the artifact. Can I Use It On All Artifacts? Principle of Operation Most artifacts can withstand the concentrated exposure from the 80190 Fading Test System. The energy delivered typically heats a test area to ~50°C. Most objects are not likely to sustain damage as a result of this modest heating, unless they have very low-melting materials, such as in wax. This system has been used effectively to test paintings, prints and drawings, sculpture, textiles and manuscripts. illuminated area is measured, and changes detected. Real time continuous color measurements monitor the course of fading. By comparing the fading rate of the test area to a known standard, its photosensitivity can be accurately determined. Fig. 1 shows the system components. MULTIPLE FILTER HOLDER WITH FILTERS FOCUSING ASSEMBLY WATER FILTER SERIES Q ARC LAMP HOUSING WITH 75 W Xe LAMP LIGHT INTENSITY CONTROL SYSTEM ARC LAMP POWER SUPPLY SPECTROMETER COLLECTION FIBER FOCUSING PROBES IN PROBE MOUNT ILLUMINATION FIBER Fig. 1 Components of 80190 Fading Test System. • Rapidly screen artifact colorants susceptible to light • Predict color changes from light exposure • Predict the longevity of a good color match for retouching • Use on most artifacts: paints, inks, textile dyes, photographs Specifications The Fading Test System delivers a concentrated pinpoint of light to a very small area of the artifact (~0.4 mm diameter), to induce fading. Simultaneously, the reflectance off the Source Type 75 W Xenon Spectral Output 400 to 700 nm (with supplied filters) Illumination Fiber 200 ìm diameter, 3.3 ft (1 m) long, fused silica fiber Collection Fiber 600 ìm diameter, 3.3 ft (1 m) long, fused silica fiber Detection System 512 element pixel photodiode array, 100 ìm slit USB interface Ordering Information Model Description 80190 Fading Test System See our website WEBfor more info

Open the catalog to page 1

All MICRO-CONTROLE / Spectra-Physics catalogs and technical brochures

  1. 10BPF10-310

    1 Pages

  2. M-401

    1 Pages

  3. newport ressource

    1640 Pages

  4. Motion PL30

    24 Pages

  5. Beamsplitters

    34 Pages

  6. Base Clamps

    1 Pages

  7. Rod Clamps

    1 Pages

  8. V-Blocks

    1 Pages

  9. Blackbodies

    2 Pages

  10. Beam Dump

    1 Pages