metkcn Technology behind Specimen

AUTOMATIC SURFACE MILLING FOR FERROUS & NON-FERROUS METALS

SPECTRAL MM 102 SPECTRAL MM 102 is designed for automatic sample preparation of OES and XRF analysis. It is fast and efficient in providing high quality specimen surface thus saving time. SPECTRAL MM 102 has advanced techniques and software with programmable HMI touch screen controls increasing the productivity, sample consistency and operator comfort. With the ability to store and recall preparation programs on the LCD screen, same consistent results are obtained. SPECTRAL MM 102 is a perfect choice for milling of all non-ferrous materials. It can also be used for milling steels upto 50 HRC SPECTRAL...

A smart clamping solution for practical daily use: pneumatic clamping device offers advantages in milling and general use. The pneumatic clamping device can be used for accurate clamping and increase productivity and ensure repeatable alignment. Air cooling system is also offered optionally which is ideal for applications hard material. SPECTRAL MM 102 has advanced techniques and software with programmable HMI touch screen controls increasing the productivity, sample consistency and operator comfort. Controlled Material Removal SPECTRAL MM 102 allows you to preset the amount of material to be removed...

Sample Preparation for Spectroscopy Optical emission spectrometry (OES) and X-Ray fluorescence are most commonly used techniques for the analysis of metals and solid samples. Sample preparation of metals and materials have become more and more important because of the rapid development and improvement of both software as well as OES and XRF-devices during the past few years that shifts the detection limit for trace analyses. It is crucial to have the sample properly prepared. The sample needs to be both representative, homogeneous and with an even surface in order to eliminate factors that can...

Weight, (kg) (with cabinet) — SPECTRAL MM 102 Automatic fine surface milling machine for preparation of non-ferrous metal samples for OES and XRF analysis, bench top compact design, Siemens PLC control unit, Programmable with colored 7" HMI touch screen control, closed housing, max. safety provided with interlocking switch, large working space with LED lighting, chip container, extraordinary access for easy handling with sliding door, for samples up to 70 mm dia. automatic sample feeding with adjustable fine speed control, controlled material removal from the specimen with accuracy of 0.01 mm,...

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