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LSM-9001NIR

Product catalog summary

Overview:
The document provides information about the LSM-9001NIR, a Near Infrared Polariscope designed for evaluating strain distribution in various materials such as silicon wafers, SiC, GaN, glass wafers, and colored glass and acrylic resin. It is a fully automatic polarimeter suitable for low phase difference products, particularly semiconductor wafers.

Key Features:

Evaluates strain distribution in Si, SiC, GaN, and glass wafers.
Capable of evaluating a 50 x 50mm area in 1 minute.
Suitable for colored glass and acrylic resin products.
Automatic quality control for silicon wafers.

Specifications:

Display Items: Retardation (nm), Stress (MPa).
Measurement Range: 0 to 150nm.
Measurement Area Size: Approximately 50 x 50mm.
Inspection Method: NIR Rotating Analyzer Method.
Size/Weight: W300 x D353 x H540mm / 22kg.

Evaluation Examples:

Silicon wafer: Strain distribution around the notch due to residual stress in the grinding process.
Black acrylic resin disc under compressive load: Strain distribution.

Additional Information:
The document mentions that product specifications are subject to change without notice and provides contact information for further inquiries. A sample measurement service is offered, and there are various polariscopes available besides the LSM-9001NIR.

Catalog excerpts

All for your highest quality Near Infrared Polariscope Fullauto StrainEye LSM-9001NIR ✔ Evaluate strain distribution of Si, SiC, GaN and glass wafers ✔ Evaluation of 50 x 50mm area in 1 minute by plane distribution ✔ Evaluate strain distribution of colored glass and acrylic resin Enables quality control of silicon wafer ■ This is a fully automatic polarimeter for low phase difference products such as semiconductor wafers. We'll evaluate your samples anytime! Target products You can evaluate resin product like these colors! ・ Transparent/colored resin products ・ Crystallized quartz / Quartz / Opt

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Evaluation Examples Silicon wafer / Colored acrylic resin molded products Silicon wafer Around the notch Strain distribution （Residual stress in the grinding process） Black acrylic resin disc under compressive load Strain distribution Near Infrared Polariscope LSM-9001NIR Display items measurement service. Measurement range Measurement area size Inspection method NIR Rotating Analyzer Method Size / Weight（body） polariscopes besides LSM-9001NIR. Please feel free to contact us via “CONTACT US”. 30-9 Ohyamakanai-cho, Itabashi-ku, Tokyo, 173-0024 TEL +81-3-3956-4111 FAX +81-3-3956-2335 URLhttps://www.luceo.jp/...

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LSM-9001NIR

LSM-9001NIR

Catalog excerpts

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