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LONGi P-Type M2 Monocrystalline Brick Specification

LONGi P-Type M2 Monocrystalline Brick Specification
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LONGi P-Type M2 Monocrystalline Brick Specification - 1

隆基绿能科技股份有限公司中国陕西省西安市长安区航天中路 388 号 710100 www.longi-silicon.com longisilicon@longi-silicon.com LONGi P-Type M2 Monocrystalline Brick Specification 隆基 P 型 M2 单晶硅棒规格书 1、Material properties 材料性能 Property 项目 Growth method Conductivity type Oxygen concentration [Oi] 间隙氧含量 Carbon Concentration [Cs] 替位碳含量 -Preferential Etch Techniques （ASTM F47-88）择优化学腐蚀法 Napson EC-80TPN P/N 型测试仪 -FTIR (ASTM F121-83) Etch pit density (dislocation density) Preferential Etch Techniques ≤ 500 cm 位错密度 Surface orientation 表面晶向择优化学腐蚀法 X-ray Diffraction Method （ASTM F26-1987

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LONGi P-Type M2 Monocrystalline Brick Specification - 2

隆基绿能科技股份有限公司中国陕西省西安市长安区航天中路 388 号 710100 www.longi-silicon.com longisilicon@longi-silicon.com Inspection Method 检测方法 0.5-1.5 Ω.cm （After anneal）退火后测试四探针电阻率测试仪退火后测试 Other Sinton BCT-400 MCLT （Minority carrier lifetime） QSSPC 准稳态光电导衰减法 /Transient 瞬态光电导衰减法 (with injection level: 1E15 cm-3) Geometry 几何外形 Vernier caliper Vernier caliper Vernier caliper Corner length 弧长投影 Wide-seat square/ruler Angle ruler Corner shape 倒角边形状 Round shape Visual inspection

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LONGi P-Type M2 Monocrystalline Brick Specification - 3

隆基绿能科技股份有限公司中国陕西省西安市长安区航天中路 388 号 710100 www.longi-silicon.com longisilicon@longi-silicon.com 4、Surface properties 表面性能 Property 项目 Inspection Method 检测方法 Stain, Oil, Scratch, Crack, Pit, Bump, Pinhole and Twin defect are not allowed. Visual inspection Surface chip is not allowed; Arris: chips are inconsecutive: Less than 10 on the arris, dia≤0.3mm; Plane surface : Ra≤0.6um; Cambered surface : Ra≤1.0um Surface roughness meter

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