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- GI20 Flatness
GI20 Flatness
GI20 Flatness
- The GI20 can measure both reflective and non-reflective surfaces by reflecting laser light at a grazing incidence angle.
- It is versatile, suitable for semiconductor wafers, optical components, machine components, and geological samples.
- The system features a touch screen interface for rapid measurement and data saving, with fringe spacing displayed at a fixed 2um interval.
- Interferograms can be displayed on the unit's screen or an external monitor via HDMI, and exported via USB for further analysis.
- Flat specimen: Linear fringe pattern indicates the sample is angled to the optical reference surface.
- Convex/Concave specimen: Fringe movement direction shows the sample's curvature.
- Flat specimen with peaks/valleys: Annular fringe pattern indicates parallel plane presentation.
- Maximum Sample Size: 150mm / 6 inches
- Height: 260mm, Width: 430mm, Depth: 602mm
- Weight: 24kg
- Power Supply: 220-240v 50-60Hz / 110v 60Hz
- Surface Roughness: 1nm - 300nm
- Fringe Spacing: 2um
Catalog excerpts
GI20 FLATNESS MEASUREMENT SYSTEM High precision flatness measurement, grazing incidence interferometer for use with lapped and semi-polished surfaces.
Open the catalog to page 1
FLATNESS MEASUREMENT →→Standard fiseau interferometers normally operate with fringe spacing approximately 0.3um (depending on wavelength), therefore restricting measurement to highly reflective materials. The Logitech GI20 overcomes this by reflecting laser light at a grazing incidence angle off the sample surface - this angled beam ensures that the monitor shows fringes on both reflective and non-reflective sample surfaces. SYSTEM The Logitech GI20 grazing incidence interferometer provides high precision flatness measurement, suitable for use with lapped and semi-polished surface up to 150mm/6”....
Open the catalog to page 2
TECHNICAL SPECIFICATIONS Power Supply: Surface Roughness: Fringe Spacing: Maximum Sample Size:
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