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x-ray orientation for silicon ingot 111 plane

x-ray orientation for silicon ingot 111 plane
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x-ray orientation for silicon ingot 111 plane - 1

Yx-2D6A$BBBs^ft^s«;ftsiS]«s^±, its. ±gfflTaBaistt> A*ft mm, W>M2-83?TtH[ltt, Aft. aBa#^g500mm„ £frffilt±30" & ±15" . mtt\I, mail, mT&mtikmvm. ■ \mn : «A&si: (nonfr, >5!«fr«jA#;t^®i4° h' oo" .^jia^gu0 i6- 10" ±^«aeg^it»^ii4g*^0.036° , anretffltt* g*#«J#EXCELASt*flEiTEP^«#. *#&2D6Af||5]) ■ im-. iSL (GA, GB> GC> GD, GE, GF> GH) YX-2D6A Radiation Crystal Orientation Instrument YX-2D6A single crystal orientation instrument: is basic of standard orientation instrument, designed for multiple crystal such as single crystal silicon, sapphire, gallium arsenide arsenide and so on, it m ainly used for measurement of crystal rounding plate and crystal bar, it can measures 2-8inch wafer, crystal bar whoes length is 500mm. The orientation precision of ±30”or±15”. with convenient opera tion, outside displayer, and bearing rail inclusion, this model of unit belongs to common hot sales m odel products. YX-2D6A-S crystal orientation instrument has digital output functions; Such as: single crystal silicon SI: (111) crystal direction, before measurement we inputs standard a ngle of 14°14'00". After upload the actual measurement angle 14°16"IO"to computer, will get calcul ation error result is 0.036° automatically, we don’t need to manually calculates, and also can save t he results into EXCEL form so that will convenient for printing and saving, (the configuration is sam e as 2D6A parameters) Specifications: Clients who uses both surfaces angular instrument also can select different model a ngular device according to crystal dimension and shapes, please select configuration by referring to G series (GA^ GB< GC> GD, GE> GF< GH) angular instrument manufactured by our company.

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