x-ray orientation instrument for sapphire wafer
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x-ray orientation instrument for sapphire wafer - 1

YX-4 high precision indicator is professionally designed according to high testing precision of crystal. It applies antelocation quartz crystal monochromator, impro ve the testing definition through double diffract way. Its precision is ±15 " , the dis player applies single chip six bit displaying, the minimum reading value is 1" , su itable for the factory using of process crystal. The above images just for reference, can change according the customer clamp.

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