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x-ray diffractometer for silicon wafer
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x-ray diffractometer for silicon wafer

x-ray diffractometer for silicon wafer
1 /1Page

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x-ray diffractometer for silicon wafer-1

YX-2H8 X beam crystal direction finder characteristic: The 2H8 direction finder is on the original 2 molding machines, in view of silicon unit crystal design. Mainly uses in the chip, the crystal stick survey; To the pipe socket, the angular instrument make the improvement, the sample increase load-bearing track, the observable diameter 2-8 inch chip, the long 500 crystals stick, the sample board area 60 (width) [BO (high), mainly surveys the angle: Silicon 110, 111, 100 and so on other related crystal angles. Two side angular instruments users may act according to this company sample specification shape, selects and matches differently measures So, G series angular instrument (GA, GB, GC, GD, GE). Technical specification Dandong liaoning Radioative Instrument co.ltd. No.348 ShanShang StreetZhenxing District Dandong City Liaoning Province,China Tel :0415-2150150 http:www.fxyqc.com Fax:0415-2151390 E-mail:[email protected] Person contact:Wang Yong li 13904255102

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